This book introduces readers interested in the field of X-rayPhotoelectron Spectroscopy (XPS) to the practical concepts in thisfield. The book first introduces the reader to the language andconcepts used in this field and then demonstrates how theseconcepts are applied. Including how the spectra are produced,factors that can influence the spectra (all initial and final stateeffects are discussed), how to derive speciation, volume analysedand how one controls this (includes depth profiling), andquantification along with background substraction and curve fittingmethodologies.
This is presented in a concise yet comprehensive manner and eachsection is prepared such that they can be read independently ofeach other, and all equations are presented using the most commonlyused units. Greater emphasis has been placed on spectralunderstanding/interpretation. For completeness sake, a descriptionof commonly used instrumentation is also presented. Finally, somecomplementary surface analytical techniques and associated conceptsare reviewed for comparative purposes in stand-alone appendixsections.
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ISBN-13
978-1-118-16290-3 (9781118162903)
Schweitzer Klassifikation
