Electron microscopy has revolutionized our understanding the extraordinary intellectual demands required of the mi of materials by completing the processing-structure-prop croscopist in order to do the job properly: crystallography, erties links down to atomistic levels. It now is even possible diffraction, image contrast, inelastic scattering events, and to tailor the microstructure (and meso structure ) of materials spectroscopy. Remember, these used to be fields in them to achieve specific sets of properties; the extraordinary abili selves. Today, one has to understand the fundamentals ties of modem transmission electron microscopy-TEM of all of these areas before one can hope to tackle signifi instruments to provide almost all of the structural, phase, cant problems in materials science. TEM is a technique of and crystallographic data allow us to accomplish this feat. characterizing materials down to the atomic limits. It must Therefore, it is obvious that any curriculum in modem mate be used with care and attention, in many cases involving rials education must include suitable courses in electron mi teams of experts from different venues. The fundamentals croscopy. It is also essential that suitable texts be available are, of course, based in physics, so aspiring materials sci for the preparation of the students and researchers who must entists would be well advised to have prior exposure to, for carry out electron microscopy properly and quantitatively.
Rezensionen / Stimmen
`The best textbook for this audience available.'
American Scientist, January-February 1998
`Ideally suited to the needs of a graduate level course. It is hard to imagine this book not fulfilling most of the requirements of a text for such a course.'
Microscope
`This book is written in such a comprehensive manner that it is understandable to all people who are trained in physical science and it will be useful both for the expert as well as the student.'
Micron
`The book answers nearly any question - be it instrumental, practical, or theoretical - either directly or with an appropriate reference...This book provides a basic, clearcut presentation of how transmission electron microscopes should be used and of how this depends specifically on one's specific undergoing project.'
MRS Bulletin, May 1998
`The only complete text now available which includes all the remarkable advances made in the field of TEM in the past 30-40 years....The authors can be proud of an enormous task, very well done.'
from the Foreword by Professor Gareth Thomas, University of California, Berkeley
Sprache
Verlagsort
Verlagsgruppe
Illustrationen
1722
1722 s/w Abbildungen
XXIX, 729 p. 1722 illus.
Dateigröße
ISBN-13
978-1-4757-2519-3 (9781475725193)
DOI
10.1007/978-1-4757-2519-3
Schweitzer Klassifikation
1 The Transmission Electron Microscope.- 2 Scattering and Diffraction.- 3 Elastic Scattering.- 4 Inelastic Scattering and Beam Damage.- 5 Electron Sources.- 6 Lenses, Apertures, and Resolution.- 7 How to "See" Electrons.- 8 Pumps and Holders.- 9 The Instrument.- 10 Specimen Preparation.- 11 Diffraction Patterns.- 12 Thinking in Reciprocal Space.- 13 Diffracted Beams.- 14 Bloch Waves.- 15 Dispersion Surfaces.- 16 Diffraction from Crystals.- 17 Diffraction from Small Volumes.- 18 Indexing Diffraction Patterns.- 19 Kikuchi Diffraction.- 20 Obtaining CBED Patterns.- 21 Using Convergent-Beam Techniques.- 22 Imaging in the TEM.- 23 Thickness and Bending Effects.- 24 Planar Defects.- 25 Strain Fields.- 26 Weak-Beam Dark-Field Microscopy.- 27 Phase-Contrast Images.- 28 High-Resolution TEM.- 29 Image Simulation.- 30 Quantifying and Processing HRTEM Images.- 31 Other Imaging Techniques.- 32 X-ray Spectrometry.- 33 The XEDS-TEM Interface.- 34 Qualitative X-ray Analysis.- 35 Quantitative X-ray Microanalysis.- 36 Spatial Resolution and Minimum Detectability.- 37 Electron Energy-Loss Spectrometers.- 38 The Energy-Loss Spectrum.- 39 Microanalysis with Ionization-Loss Electrons.- 40 Everything Else in the Spectrum.- Acknowledgements for Figures.