Experimental and Applied Mechanics, Volume 6

Electrical Impedance Spectroscopy for Structural Health Monitoring.- In situ observation of NiTi Transformation Behaviour: A Micro-macro Approach.- Bio-inspired Design of a Multi-scale Pass Band Frequency Sensor Using Local Resonance Phenomena.- Dynamic Equations for an Isotropic Spherical Shell Using Power Series Method and Surface Differential Operators.- Hydrogen Embrittlement and "Cold Fusion" Effects in Palladium During Electrolysis Experiments.- Torque Arm Actuated Bi-Stable Buckled Energy Harvester Characterization.- Validating FSI Simulations in LS-DYNA 980.- Fundamental Frequencies of Slender Beams Subject to Imposed Axial End Displacements.- Characterization of a Heating and Quenching Apparatus for Microgravity Testing.- Phase Unwrapping Work Done via Graphic Processing Unit.- Classification of Low Velocity Impact Using Spiral Sensing Technique.- Residual Stress Measurements in Finite-Thickness Materials by Hole-Drilling.- Residual Stress Response to Peening in Metallic Glass.- Residual Stress Modeling and Measurement in An Aluminum Wrought Alloy.- Notch Fatigue Behaviour of Shot Peened High-strength Aluminium Alloys: Role of the Residual Stress Field Ahead of the Notch Root.- Residual Stress of Individual Aluminum Grains from Three Dimensional X-Ray Diffraction.- Incremental Ring Core by Optical Methods. Preliminary Results.- Uncertainty Quantification in VFM Identification.- Modal Identification of Over-damped Structural Systems Using Extended Ibrahim Time-Domain Method.- Structural Health Monitoring by Laser Shearography: Experimental and Numerical Investigations.- On Improving Thermoelastic Stress Analysis Data Near Edges of Discontinuities.- Measurement of Stress Network in Granular Materials from Infrared Measurement.- Influence of Relative Humidity Upon the Thermomechanical Behavior Of PA6.6.- Temperature Field in FSW Process: Experimental Measurement and Numerical Simulation.- Dynamics of Strain Localization Associated With LudersDeformation - An Insight.- Raman Spectroscopy-enhanced IIT: In situ Analysis of Mechanically Stressed Polycrystalline Si Fhin Films.