Silicon Carbide Wafer Manufacturing, Optoelectronic and Electronic Devices and Technologies

<ul><li>Preface</li><li>Chapter 1: Silicon Carbide Wafer Manufacturing</li><li>Epitaxial Growth of Boron Carbide on 4H-SiC</li><li>Prevention of Bunched Basal Plane Dislocation Arrays in 4H-SiC PVT-Growth</li><li>Improvement of the Conformational Stability of 150 mm 4H SiC Wafers</li><li>High Quality Single Crystal Recrystallization of Thin 4H-SiC Films Deposed by PVD Techniques, a way for New Emerging Fields</li><li>Effect of Sub-Surface Damage Layer Removal by Sublimation Etching of 4H-SiC Bulk Wafers on PL Imaging of Crystal Defect Visibility</li><li>Temperature Gradient Control with an Air-Pocket Design for Growth of High Quality SiC Crystal</li><li>4H-SiC Full Wafer Mapping Image of CMP-Finished Sub-Surface Damage by Laser Light Scattering</li><li>Investigation of the Nucleation Process during the Initial Stage of PVT Growth of 4H-SiC</li><li>Al Implantation in Sic; Where Will the Ions Come to Rest?</li><li>Chapter 2: Electronic Packaging</li><li>Analysis of Transmission Performance for Fine Pitch Interconnect</li><li>Interfacial Delamination Validation on Fan-Out Wafer-Level Package Using Finite Element Method</li><li>Fabrication of Nanocomposite PDMS/Graphene as Flexible Substrate at Different Graphene Volume</li><li>Chapter 3: Optoelectronic and Electronic Devices</li><li>Performance of MOS Capacitor with Different Dielectric Material Simulated Using Silvaco TCAD Tools</li><li>Humidity Sensor Performance Based ZnO/SnO₂ Nanorods Structure Using Different ZnO Seed Layer</li><li>Opto-Electronic Characterisation of GaAsBi/GaAs Multiple Quantum Wells for Photovoltaic Applications</li><li>Characterization of Breath Sensor at Different Frequencies in Outdoor Condition</li></ul>