Cluster Secondary Ion Mass Spectrometry

Explores the impact of the latest breakthroughs in clusterSIMS technology
Cluster secondary ion mass spectrometry (SIMS) is a high spatialresolution imaging mass spectrometry technique, which can be usedto characterize the three-dimensional chemical structure in complexorganic and molecular systems. It works by using a cluster ionsource to sputter desorb material from a solid sample surface.Prior to the advent of the cluster source, SIMS was severelylimited in its ability to characterize soft samples as a result ofdamage from the atomic source. Molecular samples were essentiallydestroyed during analysis, limiting the method's sensitivity andprecluding compositional depth profiling. The use of new andemerging cluster ion beam technologies has all but eliminated theselimitations, enabling researchers to enter into new fields onceconsidered unattainable by the SIMS method.
With contributions from leading mass spectrometry researchersaround the world, Cluster Secondary Ion Mass Spectrometry:Principles and Applications describes the latest breakthroughsin instrumentation, and addresses best practices in cluster SIMSanalysis. It serves as a compendium of knowledge on organic andpolymeric surface and in-depth characterization using cluster ionbeams. It covers topics ranging from the fundamentals and theory ofcluster SIMS, to the important chemistries behind the success ofthe technique, as well as the wide-ranging applications of thetechnology. Examples of subjects covered include:
* Cluster SIMS theory and modeling
* Cluster ion source types and performance expectations
* Cluster ion beams for surface analysis experiments
* Molecular depth profiling and 3-D analysis with cluster ionbeams
* Specialty applications ranging from biological samples analysisto semiconductors/metals analysis
* Future challenges and prospects for cluster SIMS
This book is intended to benefit any scientist, ranging frombeginning to advanced in level, with plenty of figures to helpbetter understand complex concepts and processes. In addition, eachchapter ends with a detailed reference set to the primaryliterature, facilitating further research into individual topicswhere desired. Cluster Secondary Ion Mass Spectrometry:Principles and Applications is a must-have read for anyresearcher in the surface analysis and/or imaging mass spectrometryfields.