This book constitutes the refereed proceedings of the 21st International Symposium on VLSI Design and Test, VDAT 2017, held in Roorkee, India, in June/July 2017.
The 48 full papers presented together with 27 short papers were carefully reviewed and selected from 246 submissions. The papers were organized in topical sections named: digital design; analog/mixed signal; VLSI testing; devices and technology; VLSI architectures; emerging technologies and memory; system design; low power design and test; RF circuits; architecture and CAD; and design verification.
Reihe
Auflage
Sprache
Verlagsort
Verlagsgruppe
Illustrationen
486
486 s/w Abbildungen
XXI, 815 p. 486 illus.
ISBN-13
978-981-10-7470-7 (9789811074707)
DOI
10.1007/978-981-10-7470-7
Schweitzer Klassifikation
