X-Ray Fluorescence Spectrometry

X-ray fluorescence spectroscopy, one of the most powerful andflexible techniques available for the analysis and characterizationof materials today, has gone through major changes during the pastdecade.
Fully revised and expanded by 30%, X-Ray Fluorescence Spectrometry,Second Edition incorporates the latest industrial and scientifictrends in all areas. It updates all previous material and adds newchapters on such topics as the history of X-ray fluorescencespectroscopy, the design of X-ray spectrometers, state-of-the-artapplications, and X-ray spectra.
Ron Jenkins draws on his extensive experience in training andconsulting industry professionals for this clear and concisetreatment, covering first the basic aspects of X rays, then themethodology of X-ray fluorescence spectroscopy and availableinstrumentation. He offers a comparison between wavelength andenergy dispersive spectrometers as well as step-by-step guidelinesto X-ray spectrometric techniques for qualitative and quantitativeanalysis-from specimen preparation to real-world industrialapplication.
Favored by the American Chemical Society and the InternationalCentre for Diffraction Data, X-Ray Fluorescence Spectrometry,Second Edition is an ideal introduction for newcomers to the fieldand an invaluable reference for experienced spectroscopists-inchemical analysis, geology, metallurgy, and materialsscience.
An up-to-date review of X-ray spectroscopic techniques. This provenguidebook for industry professionals is thoroughly updated andexpanded to reflect advances in X-ray analysis over the lastdecade. X-Ray Fluorescence Spectrometry, Second Editionincludes:
* The history of X-ray fluorescence spectrometry-new to thisedition.
* A critical review of the most useful X-ray spectrometers.
* Techniques and procedures for quantitative and qualitativeanalysis.
* Modern applications and industrial trends.
* X-ray spectra-new to this edition.