Advanced Tomographic Methods in Materials Research and Engineering

Name: Advanced Tomographic Methods in Materials Research and Engineering
Brand: Oxford University Press
Price: 167.39 EUR
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BANHART JOHN(Autor*in)

Oxford University Press

1. Auflage

Erschienen am 20. März 2008

489 Seiten

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978-0-19-152662-6 (ISBN)

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Inhalt

Intro
Contents
I: BASIC CONCEPTS
1 Introduction
1.1 History and motivation
1.2 What is tomography?
1.3 What is resolution?
1.4 Tomographic methods not further treated in this book
1.5 Summary
1.6 References
2 Some mathematical concepts for tomographic reconstruction
2.1 Foundations of reconstruction from projections
2.2 Examples of reconstruction methods
2.3 Some problems associated with the application of reconstruction algorithms
2.4 Summary
2.5 References
3 Visualization, processing and analysis of tomographic data
3.1 Lattices, adjacency of lattice points, and images
3.2 Visualization
3.3 Processing of image data
3.4 Segmentation
3.5 Analysis of image data
3.6 Modelling materials properties
3.7 References
4 Radiation sources and interaction of radiation with matter
4.1 General definitions
4.2 Generation of X-rays and their interaction with matter
4.3 Generation of electrons and their interaction with matter
4.4 Generation of neutrons and their interaction with matter
4.5 Comparison of interactions
4.6 Summary
4.7 References
II: SYNCHROTRON X-RAY TOMOGRAPHY
5 Synchrotron X-ray absorption tomography
5.1 Synchrotron radiation for tomography
5.2 Principles of synchrotron X-ray tomography
5.3 Data reconstruction
5.4 Image artefacts
5.5 Applications and 3D image analysis
5.6 Summary
5.7 References
6 Phase-contrast and holographic tomography
6.1 Propagation of light and phase contrast
6.2 Interferometry for phase tomography
6.3 Differential interferometry
6.4 Zernike phase contrast for tomography
6.5 Diffraction-enhanced imaging
6.6 Propagation-based phase tomography
6.7 Coherent diffractive imaging
6.8 Polychromatic phase imaging
6.9 Summary
6.10 References
7 Tomography using magnifying optics
7.1 Fresnel zone-plate microscopy and microtomography
7.2 Hard X-ray microscopy and tomography based on refractive and reflective optics
7.3 Summary
7.4 References
8 Scanning tomography
8.1 Fluorescence tomography
8.2 X-ray absorption and small-angle scattering tomographies
8.3 Summary
8.4 References
9 Three-dimensional X-ray diffraction
9.1 Basic setup and strategy
9.2 Indexing and characterization of average properties of each grain
9.3 Mapping of grains within undeformed specimens
9.4 Mapping of orientations within deformed specimens
9.5 Combining 3DXRD and tomography
9.6 3DXRD microscopes
9.7 Geometric principles
9.8 Summary and outlook
9.9 References
10 Detectors for synchrotron tomography
10.1 Scintillation mechanism
10.2 Spatial resolution and detective quantum efficiency
10.3 Powder screens
10.4 Crystal converter screens
10.5 Optical coupling
10.6 Readout based on CCD cameras
10.7 Review of potential solutions for large field of view detector
10.8 Summary
10.9 References
III: ELECTRON TOMOGRAPHY
11 Fundamentals of electron tomography
11.1 Introduction
11.2 Tomography using the electron microscope
11.3 Alignment and reconstruction
11.4 Bright-field and dark-field electron tomography
11.5 HAADF STEM tomography
11.6 EFTEM tomography
11.7 Unconventional modes for electron tomography
11.8 References
12 Applications of electron tomography
12.1 Applications in materials research
12.2 Applications in semiconductor industry
12.3 References
IV: NEUTRON TOMOGRAPHY
13 Neutron absorption tomography
13.1 Interaction of neutron radiation with matter and comparison to X-rays
13.2 Specifics of neutron tomography
13.3 Limitations in neutron tomography
13.4 Selected applications and experimental options
13.5 Summary
13.6 References
14 Neutron phase-contrast and polarized neutron tomography
14.1 Theory of phase-contrast imaging
14.2 Experimental techniques for phase-contrast imaging
14.3 Imaging with polarized neutrons
14.4 Conclusions and outlook
14.5 References
15 Neutron-refraction and small-angle scattering tomography
15.1 Refraction tomography
15.2 Small-angle scattering tomography
15.3 Experimental results: refraction tomography
15.4 Experimental results: small-angle tomography
15.5 References
A: Facilities for tomography
A.1 Synchrotron tomography
A.2 Neutron tomography
A.3 Electron tomography
A.4 References
B: Examples on CD-ROM
B.1 References
Index
A
B
C
D
E
F
G
H
I
J
K
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M
N
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P
Q
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