This second edition enables readers to design lens systems for focusing beams of charged particles that have useful characteristics. The book covers the basic theory of the motion of charged particles in electrostatic fields and describes several methods for the calculation of the potential and field distribution for various electrode geometries. It emphasizes the Bessel function expansion method and the nine-point implementation of the finite difference method. The accompanying disk provides a suite of computer programs (LENSYS for MS-DOS) intended for practical use in the design and analysis of systems using round lenses with apertures or cylindrical elements.
Rezensionen / Stimmen
Praise for the previous edition:
"... this book is a very useful companion to the SIMION program for the design of low energy particle optics."
-Australian and New Zealand Physicist
"Good value for money for those purchasers who want a computer-based learning aid along with a well written supporting text."
-Optics and Lasers in Engineering
"These programs will be of value even to experienced workers in the field who may be quite familiar with much of the material in the text."
-W. Steckelmacher, Elsevier Science, INSPEC
Auflage
Sprache
Verlagsort
Verlagsgruppe
Zielgruppe
Für Beruf und Forschung
Postgraduate students and research physicists working on the design of charged particle systems; manufacturers of systems who analyze charged particle processes; advanced undergraduates studying charged particle physics.
Editions-Typ
Illustrationen
42 s/w Abbildungen
42 b/w images
Dateigröße
ISBN-13
978-1-4200-3439-4 (9781420034394)
Copyright in bibliographic data and cover images is held by Nielsen Book Services Limited or by the publishers or by their respective licensors: all rights reserved.
Schweitzer Klassifikation
The optics of simple lenses. The motion of charged particles in an electrostatic field. The determination of the axial potential. The optics of simple lens systems. Aberrations. The LENSYS program. Technical aspects of LENSYS. References.