Volume 7 of Developments in Applied Spectroscopy is a collection of forty-two papers selected from those that were presented at the 7th National Meeting of the Society of Applied Spectroscopy, held (in place of the 19th Mid-America Symposium on Spectroscopy) in Chicago, May 13-17, 1968. These papers, selected by the editors and reviewed by persons knowledgeable in the field, are those of the symposium type and not those pertaining to specific research topics that one would expect to be submitted to a journal. It is the opinion of the committee that this type of publication has an important place in the literature. The relatively large number of papers would result in quite a sizable volume if bound in one set of covers. For this reason, and to present the material in areas of more specific mterest, Volume 7 was divided into two parts, Part A, Physical-Inorganic, and Part B, Physical-Organic Developments. The 7th National Meeting was sponsored by the Chicago Section as host in cooperation with the St. Louis, New England, Penn York, Niagara-Frontier, Cincinnati, Ohio Valley, New York, Baltimore-Washington, North Texas, Rocky Mountain, and Southeastern Sections of the Society for Applied Spectroscopy and the Chicago Gas Chromatography Group. The editors wish to express their appreciation to the authors and to those who helped with the reviewing. The latter include Dr. Elma Lanterman, Mr. John E. Forrette, Dr. Carl Moore, Dr. B. Jaselskis, Mr. H. G. Zelinski, Mr.
Reihe
Auflage
Sprache
Verlagsort
Verlagsgruppe
Illustrationen
40 s/w Abbildungen
IX, 341 p. 40 illus.
ISBN-13
978-1-4684-8700-8 (9781468487008)
DOI
10.1007/978-1-4684-8700-8
Schweitzer Klassifikation
Dispersive and Nondispersive X-Ray Fluorescence Methods for the Measurement of the Thicknesses of Films of Cadmium Sulfide and Other II-VI Compounds.- Applications of X-Ray Topography in the Characterization of Semiconductor Surface Layers.- High-Energy Electron-Diffraction and X-Ray Emission Analysis of Surfaces and Their Reaction Products.- Surface Analysis with the Electron Probe.- Experience with a Computer-Coupled X-Ray Spectrometer.- Use of Total Reflection at the Critical Angle for Dispersion of Ultrasoft X-Rays.- The Shift in Wavelength with Voltage of Certain X-Ray Lines.- Spectroscopy Study of Hot Gases.- Analysis of Plant-Ash Solutions by Spark-Emission Spectroscopy.- Routine Industrial Analysis of Stainless Steels.- Some Difficult Working Areas in Atomic-Absorption Flame Photometry.- A New Look at Calcium Flame Interferences.- Some Experimental Considerations in Atomic Absorption.- An Experimental Device for Atomic-Absorption Spectroscopy.- Indirect Atomic-Absorption Spectrometric Methods of Analysis.- Atomic-Absorption Spectrophotometry in Mineral and Trace-Element Studies in Man.- Investigation of Solids by Means of an Ion-Bombardment Mass Spectrometer.- Application of Mass Spectrometry to Forensic Toxicology. I. Acidic and Neutral Drugs.- Identification and Determination of Oxidation Inhibitors in Synthetic Lube Oils by Ultraviolet and Mass Spectrometry.- Spectroscopy in Space-An Introduction and Overview.- A Computer-Controlled System for Automatically Scanning and Interpreting Photographic Spectra.- Nuclear Applications of Liquid Scintillation Systems.- A Comparison of the Function of the Slit in Light-Absorption Studies Using Tungsten and Laser Sources.
