This book will introduce design methodologies, known as Built-in-Self-Test (BiST) and Built-in-Self-Calibration (BiSC), which enhance the robustness of radio frequency (RF) and millimeter wave (mmWave) integrated circuits (ICs). These circuits are used in current and emerging communication, computing, multimedia and biomedical products and microchips. The design methodologies presented will result in enhancing the yield (percentage of working chips in a high volume run) of RF and mmWave ICs which will enable successful manufacturing of such microchips in high volume.
Reihe
Sprache
Verlagsort
Verlagsgruppe
Illustrationen
70
70 s/w Abbildungen
XVII, 89 p. 70 illus.
Dateigröße
ISBN-13
978-1-4419-9548-3 (9781441995483)
DOI
10.1007/978-1-4419-9548-3
Schweitzer Klassifikation
Introduction and Motivation.- Radio Systems Overview: Architecture, Performance and Built-in-Test.- Efficient Testing for RF SoCs.- RF Built-in-Self-Test.- RF Built-in-Self-Calibration.- Conclusions.
