Handbook of Microscopy

METHODS I:

LIGHT MICROSCOPY
Reflection Microscopy
Transmission Microscopy
Raman Microscopy
Three-dimensional Light Microscopy
Near Field Light Microscopy
Infrared Microscopy
X-RAY MICROSCOPY
Soft X-ray Imaging
X-ray Microradiography
X-ray Microtomography
X-ray Holographic Imaging
X-ray Topography
ACOUSTIC MICROSCOPY
Scanning Acoustic Microscopy
Photoacoustic Microscopy
Electron Acoustic Microscopy
Scanning Laser Acoustic Microscopy
ELECTRON MICROSCOPY
Stationary Beam Methods

METHODS II:

ELECTRON MICROSCOPY
Scanning Beam Methods
Magnetic Methods: NMR-Microscopy
Scanning Electron Microscopy with Polarization Analysis (SEMPA)
EMISSION METHODS
Photoemission Electron Microscopy
Field Emission Microscopy (FEM)
Field Ion Microscopy
SCANNING POINT PROBE TECHNIQUES
Scanning Tunnelling Microscopy STM
Atomic Force Microscopy AFM
Magnetic Force Microscopy MFM
Ballistic Electron Emission Microscopy (BEEM)
Methods Under Development
IMAGE RECORDING
HANDLING AND PROCESSING
Electronic Image Recording
Image Processing
SPECIAL TOPICS
Coincidence Microscopy
Low Energy Holography

APPLICATIONS:

CLASSES OF MATERIALS
Metals and Alloys
Rocks and Minerals
Semiconductors and Semiconducting Devices
Opto-electronic Materials
Ferroic Materials
Structural Ceramics
Gemmological Applications
Superconductors: Intermetallics and Ceramics
Nonperiodic Structures
Dental and Biomaterials
Application of TEM and SAED
Different Forms of Carbon
Composite Structural Materials
Polymers
Nuclear Materials
Magnetic Materials
SPECIAL TOPICS
Phase Transformations
Specimen Preparation Techniques
Environmental Problems
Thin Film Growth
Quantitative Hyleography