Immittance Spectroscopy

Name: Immittance Spectroscopy | Applications to Material Systems
Brand: Wiley
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Applications to Material Systems

Mohammad A. Alim(Autor*in)

Wiley (Verlag)

1. Auflage

Erschienen am 12. Dezember 2017

426 Seiten

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Beschreibung

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Inhalt

Intro
Title page
Copyright page
Dedication
Background of this Book
Acknowledgments
Chapter 1: Introduction to Immittance Spectroscopy
1.1 Basic Definition and Background
1.2 Scope and Limitation
1.3 Applications of the Immittance Studies to Various Material Systems
1.4 Concept of the Linear Circuit Elements: Resistance, Capacitance, and Inductance
1.5 Concept of Impedance, Admittance, Complex Capacitance, and Modulus
1.6 Immittance Functions
1.7 Series Resonant Circuit
1.8 Parallel Resonant Circuit
1.9 Capacitance and Inductance in Alternating Current
Problems
References
Chapter 2: Basics of Solid State Devices and Materials
2.1 Overview of the Fundamentals of Physical Electronics
2.2 Basics of Semiconductors
2.3 Single-Crystal and Polycrystal Materials
2.4 SCSJ and MPCHPH Systems
2.5 Representation of the Competing Phenomena
2.6 Effect of Normalization of the Electrical Parameters
Problems
References
Chapter 3: Dielectric Representation and Operative Mechanisms
3.1 Dielectric Constant of Materials: Single Crystals and Polycrystals
3.2 Dielectric Behavior of Materials: Single Crystals and Polycrystals
3.3 Origin of Frequency Dependence
3.4 Effect of Polarization
3.5 Equivalent Circuit Representation of the Mechanisms and Processes
3.6 Defects and Traps
3.7 Point Defects and Stoichiometric Defects
3.8 Leaky Systems
Problems
References
Chapter 4: Ideal Equivalent Circuits and Models
4.1 Concept of Equivalent Circuit
4.2 Simple and Basic Circuits in Complex Planes: R, C, R-C Series, and R-C Parallel
4.3 Debye Circuits: Single Relaxation
4.4 Duality of the Equivalent Circuits: Multiple Circuits for a Single Plane
4.5 Duality of Equivalent Circuits between Z*- and M*-Planes for Relaxations without Intercept
4.6 Duality of Equivalent Circuits between Y*- and C*-Planes for Relaxations without Intercept
4.7 Duality of Equivalent Circuits for Simultaneous Z*-, Y*-, C*-, and M*-Planes' Relaxations
4.8 Proposition of Equivalent Circuit: Polycrystalline Grains and Grain Boundaries
Problems
References
Chapter 5: Debye and Non-Debye Relaxations
5.1 Ideal Systems
5.2 Non-Ideal Systems
5.3 Non-Ideal Systems Implying Distributed Time Constants
5.4 D-C Representation, Depression Parameter, and Equivalent Circuit: Conventional Domain
5.5 Depression Parameter Based on ?tpeak = 1: Complex Domain
5.6 Optimization of ZHF: Complex Domain
5.7 Depression Parameter ß Based on ?tpeak = 1
5.8 Feature of the Depression Parameter ß Based on ?t ? 1
5.9 Analysis of the Havriliak-Negami Representation
5.10 Geometrical Interpretation of H-N Relaxation at the Limiting Case
5.11 Extraction of the Relaxation Time t and the H-N Depression Parameters a and ß
5.12 Checking Generalized Depression Parameter ß when a is Real
5.13 Checking Generalized Depression Parameter a when ß is Real
5.14 Effect of a and ß on the H-N Distribution Function
5.15 Meaning of the Depression Parameters a and ß
5.16 Relaxation Function with Respect to the Depression Parameters a and ß
Problems
References
Chapter 6: Modeling and Interpretation of the Data
6.1 Equivalent Circuit Model for the Single Complex Plane (SCP) Representation
6.2 Models and Circuits
6.3 Nonconventional Circuits
6.4 Multiple Equivalent Circuits for Multiple Relaxations in a Single Complex Plane
6.5 Single Equivalent Circuit for Multiple Complex Planes
6.6 Equivalent Circuit for Resonance
6.7 Single Equivalent Circuit from Z*- and M*-Planes
6.8 Temperature and Bias Dependence of the Equivalent Circuit Modeling
6.9 Equivalent Circuit: Zinc Oxide (ZnO) Based Varistors
6.10 Equivalent Circuit: Lithium Niobate (LiNbO3) Single Crystal
6.11 Equivalent Circuit: Polycrystalline Yttria (Y2O3)
6.12 Equivalent Circuit: Polycrystalline Calcium Zirconate (CaZrO3)
6.13 Equivalent Circuit: Polycrystalline Calcium Stannate (CaSnO3)
6.14 Equivalent Circuit: Polycrystalline Titanium Dioxide (TiO2)
6.15 Equivalent Circuit: Multi-Layered Thermoelectric Device (Alternate SiO2/SiO2+Ge Thin-Film)
6.16 Equivalent Circuit: Polycrystalline Tungsten Oxide (WO3)
6.17 Equivalent Circuit: Biological Material - E. Coli Bacteria
Problems
References
Chapter 7: Data-Handling and Analyzing Criteria
7.1 Acquisition of the Immittance Data
7.2 Lumped Parameter/Complex Plane Analysis (LP/CPA)
7.3 Spectroscopic Analysis (SA)
7.4 Bode Plane Analysis (BPA)
7.5 Misrepresentation of the Measured Data
7.6 Misinterpretation of the Bode Plot: Equivalent Circuit
Problems
References
Chapter 8: Liquid Systems
8.1 Non-Crystalline Systems: Liquids
8.2 Warburg and Faradaic Impedances
8.3 Constant Phase Element (CPE)
8.4 Biological Liquid: E. Coli Bacteria
Problems
References
Chapter 9: Case Studies
9.1 Analysis of the Measured Data: Aspects of Data-Handling/Analyzing Criteria
9.2 Case 1: Proper Physical Geometrical Factors
9.3 Case 2: Improper Normalization
9.4 Case 3: Effect of Electrode and Lead Wire
9.5 Case 4: Identification of Contributions to the Terminal Immittance
9.6 Case 5: Use of Proper Unit
9.7 Case 6: Demonstration of the Invalid Plot
9.8 Case 7: Obscuring Frequency Dependence
9.9 Case 8: Misnomer Nomenclature for the Complex Plane Plot
9.10 Case 9: Extraction of Equivalent Circuit from the Straight Line or the Non-Relaxation Curve
Problems
References
Chapter 10: Analysis of the Complicated Mott-Schottky Behavior
10.1 Capacitance - Voltage (C-V) Measurement
10.2 The Mott-Schottky Plot
10.3 Arbitrary Measurement Frequency and Construction of the Deceiving Mott-Schottky Plot
10.4 Frequency-Independent Representation
10.5 Extraction of the Device-Related Parameters
Problems
References
Chapter 11: Analysis of the Measured Data
11.1 Introduction and Background of the Immittance Data Analysis
11.2 Measurement of the Immittance Data and Complex Plane Analysis
11.3 Nonlinear Least Squares Estimation
11.4 Complex Nonlinear Least Squares (CNLS) Fitting of the Data
11.5 Graphical User Interface Implementation of the Nonlinear Least Square Procedures: Implementation of CNLS using MATLAB
11.6 Effect of Fitting Procedure, Measurement Noise, and Solution Algorithm on the Estimated Parameters
11.7 Case Studies: CNLS Fitting of the Measured Data in the Complex Planes
11.8 Summary
Problems
References
Chapter 12: Appendices
12.1 Appendix - A: Sample Input Data for the R-C Parallel Circuit
12.2 Appendix - B: R-C Parallel Circuit Data Analysis Output in Z*-Plane
12.3 Appendix - C: R-C Parallel Circuit Data Analysis Output in M*-Plane
12.4 Appendix - D: Lithium Niobate Crystal Data Analysis Output in C*-Plane
12.5 Appendix - E: Multilayer Junction Thermoelectric Device Data Analysis Output in Y*-Plane
Index
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