Trace Analysis By Mass Spectrometry

List of ContributorsPreface1 Introductory Review 1.1 Proem 1.2 Résumé 1.3 Problems and Proposals References2 Physics and Techniques of Electrical Discharge Ion Sources 2.1 The Task of the Ion Source: From Solids to Ion Beams 2.2 Physics of Electrical Discharges in Vacuum 2.3 Techniques of Ion Formation Using Electrical Discharges 2.4 Ion Source Configurations References3 The Transmission of Ions through Double Focusing Mass Spectrometers 3.1 Focusing and Dispersing Properties of Deflection Fields 3.2 Field Combinations to Achieve Velocity Focusing in Addition to Angular Focusing 3.3 Deviations of the Properties of Real Fields from the Results of the Simplified First-Order Theory 3.4 Focusing in the z-Direction 3.5 Performance Characteristics 3.6 Existing Instruments References4 Detection and Measurement of Ions by Ion-Sensitive Plates 4.1 Introduction 4.2 General Considerations 4.3 Physical Characteristics 4.4 The Blackening Process 4.5 Plate Response and Evaluation 4.6 Plate Replacement Schemes and Special Methods 4.7 Plate Processing 4.8 Conclusions References5 Electrical Measurements of Mass Resolved Ion Beams 5.1 Introduction 5.2 Historical Development 5.3 Signal Characteristics 5.4 Signal Referencing 5.5 Scanning 5.6 Peak Switching 5.7 Errors 5.8 Detection Limits 5.9 Analysis Time 5.10 Other Applications and Techniques 5.11 Summary References6 Interpretation of Mass Spectrograph Plates 6.1 Introduction 6.2 The Spark-Source Mass Spectrograph Plate 6.3 Qualitative Analysis 6.4 Quantitative Analysis-Theoretical Considerations 6.5 Quantitative Analysis-Practical Considerations 6.6 Treatment of Results 6.7 Summary References7 Computer Techniques for Solids Analysis 7.1 Introduction 7.2 What Can/Should Computers Do for the Mass Spectrometrist? 7.3 Batch Systems 7.4 Using Time-Sharing 7.5 Dedicated or "Stand Alone" Systems-Minicomputers 7.6 Languages References8 Relating the Mass Spectrum to the Solid Sample Composition 8.1 Introduction 8.2 Elemental Discrimination and Its Control 8.3 Relative Sensitivity Factors 8.4 Standard Samples 8.5 Isotope Dilution References9 Insulators, Powders, and Microsamples 9.1 Introduction 9.2 Experimental Techniques 9.3 Analysis of Microsamples References10 The Analysis of Low-Melting and Reactive Samples 10.1 Introduction 10.2 Sodium Sampling and Handling Techniques 10.3 Analysis of Sample 10.4 Results and Discussion 10.5 On-Stream Analysis by SSMS References11 The Analysis of Radioactive Samples by Spark-Source Mass Spectrometry 11.1 Introduction 11.2 Protection 11.3 Uranium and Transuranium Samples 11.4 Other Radioactive Samples References12 The Analysis of Gases in Solids 12.1 Introduction 12.2 Standards 12.3 Vacuum Extraction and Fusion Techniques 12.4 Spark Source Technique 12.5 Ion Microprobe Mass Spectrometry 12.6 Analysis of Lunar Samples 12.7 Conclusions and Prognoses References13 Surface and Thin Films Analysis 13.1 Introduction 13.2 General Statement of the Analysis Problem 13.3 Instrumentation and Applications References14 Laser Ion Source Analysis of Solids 14.1 Introduction 14.2 Laser Source 14.3 Data Collection 14.4 Applications of Laser Source Mass Spectrometry 14.5 Sensitivity, Selectivity, Precision, and Accuracy 14.6 Uniqueness of the Laser Source ReferencesAuthor IndexSubject Index