Experts must be able to analyze and distinguish all materials, or combinations of materials, in use today-whether they be metals, ceramics, polymers, semiconductors, or composites. To understand a material's structure, how that structure determines its properties, and how that material will subsequently work in technological applications, researchers apply basic principles of chemistry, physics, and biology to address its scientific fundamentals, as well as how it is processed and engineered for use.
Emphasizing practical applications and real-world case studies, Materials Characterization Techniques presents the principles of widely used, advanced surface and structural characterization techniques for quality assurance, contamination control, and process improvement.
This useful volume:
Explores scientific processes to characterize materials using modern technologies
Provides analysis of materials' performance under specific use conditions
Focuses on the interrelationships and interdependence between processing, structure, properties, and performance
Details the sophisticated instruments involved in an interdisciplinary approach to understanding the wide range of mutually interacting processes, mechanisms, and materials
Covers electron, X-ray-photoelectron, and UV spectroscopy; scanning-electron, atomic-force, transmission-electron, and laser-confocal-scanning-florescent microscopy, and gel electrophoresis chromatography
Presents the fundamentals of vacuum, as well as X-ray diffraction principles
Explaining appropriate uses and related technical requirements for characterization techniques, the authors omit lengthy and often intimidating derivations and formulations. Instead, they emphasize useful basic principles and applications of modern technologies used to characterize engineering materials, helping readers grasp micro- and nanoscale properties. This text will serve as a valuable guide for scientists and engineers involved in characterization and also as a powerful introduction to the field for advanced undergraduate and graduate students.
Sprache
Verlagsort
Verlagsgruppe
Zielgruppe
Für höhere Schule und Studium
Undergraduate
Produkt-Hinweis
Illustrationen
208 s/w Abbildungen
208 Illustrations, black and white
Maße
Höhe: 240 mm
Breite: 161 mm
Dicke: 23 mm
Gewicht
ISBN-13
978-1-4200-4294-8 (9781420042948)
Copyright in bibliographic data and cover images is held by Nielsen Book Services Limited or by the publishers or by their respective licensors: all rights reserved.
Schweitzer Klassifikation
Nan Yang Technological University, Singapore Nanyang Technological University, Singaapore University of South Florida, Tampa, FL USA
Autor*in
Southwest University, Chongqing, China
Nanyang Technological University, Singapore
University of South Florida, Tampa, USA
Preface. Introduction. Contact Angle in Surface Analysis. X-ray Photoelectron Spectroscopy and Auger Electron Spectroscopy. Scanning Tunneling Microscopy and Atomic Force Microscopy. X-ray Diffraction. Transmission Electron Microscopy. Scanning Electron Microscopy. Chromatographic Methods. Infrared Spectroscopy and UV/Vis Spectroscopy. Macro and Micro Thermal Analyses. Laser Confocal Fluorescence Microscopy. Index.
