This fourth volume in the series is adapted to the needs of the non-expert who wishes to make measurements for the first time or the more seasoned experimenter who wishes to apply the most recent methods to new discoveries, quality control or manufacturing.
Reihe
Auflage
Sprache
Verlagsort
Verlagsgruppe
Zielgruppe
Für höhere Schule und Studium
Für Beruf und Forschung
Editions-Typ
Illustrationen
Maße
Höhe: 242 mm
Breite: 162 mm
Gewicht
ISBN-13
978-0-471-08026-8 (9780471080268)
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Schweitzer Klassifikation
Electron Microscopy of Biological (and Organic) Materials (D. Smith); Electron Microscopy of Defects in Crystals (Medium Resolution) (J. Cowley); High-Resolution Imaging of Crystalline and Amorphous Materials (D. Smith); Electron Diffraction and Microdiffraction (J. Spence); Microanalysis by Electron Energy Loss Spectroscopy and Energy Dispersive X-Ray Analysis (P. Rez); Special Electron Microscopy Techniques (J. Cowley); Scanning Electron Microscopy (L. Reimer); Light Microscopy (W. McCrone); Determination of Particle Size (G. Beyer); Index.