Extensively revised and updated with additional material included in existing chapters and new material on angle resolved XPS, surface engineering and complimentary methods.
* Includes an accessible introduction to the key spectroscopic techniques in surface analysis.
* Provides descriptions of latest instruments and techniques.
* Includes a detailed glossary of key surface analysis terms.
Produkt-Info
Auflage
Sprache
Verlagsort
Zielgruppe
Maße
Höhe: 22.7 cm
Breite: 15.8 cm
Dicke: 1.4 cm
Gewicht
ISBN-13
978-0-470-84713-8 (9780470847138)
Schweitzer Klassifikation
John F Watts is Professor of Adhesion Science in the School of Engineering at the Unversity Surrey. He currently leads a Research Group applying surface analysis methods to investigations in materials science and is Editor-in-Chief of the Wiley journal Surface and Interface Analysis.
John Wolstenholme is Marketing Manager at Thermo VG Scientific. With a background in SIMS, he has been actively involved in XPS and AES for the last twelve years.
Autor*in
The Surface Analysis Laboratory, School of Engineering, Univ. of Surrey, UK
Thermo VG Scientific, East Grinstead, UK
Preface.
Acknowledgements.
Electron Spectroscopy: Some Basic Concepts.
Electron Spectrometer Design.
The Electron Spectrum: Qualitative and Quantitative Interpretation.
Compositional Depth Profiling.
Applications of Electron Spectroscopy in Materials Science.
Comparison of XPS and AES with Other Analytical Techniques.
Glossary.
Bibliography.
