Aus dem Inhalt:
Introduction - J C Vickerman;(General Applications, Overview of major techniques) Vacuum Technology - Rod Wilson; (Explanation of principles and terminology, vacuum pumps, pressure measurement). Electron Spectroscopy for Chemical Analysis - Buddy Ratner and David Caster; (Overview of ESCA, x-ray interaction, binding energy and the chemical shift, IMFP and sampling depth, quantification, spectral features, instrumentation, spectral quality, depth profiling). Auger Electron Spectroscopy - H-J Mathieu;(Auger Process, sources of AES, chemical effects in AES, Scanning Auger Microscopy, Auger Depth Profiling, Instrumentation, Applications, Secondary Ion Mass Spectrometry - the Surface) Mass Spectrometry - J C Vickerman and A J Swift, Low Energy Ion Scattering and Rutherford Backscattering - E. Taglauer, Vibrational Spectroscopy - M Pemble;(Electron Energy Loss Spectroscopy (EELS), Raman Scattering, IR Spectroscopy) Surface Structure Determination by Interference Techniques - Wendy Flavell, (electron diffraction techniques, low energy electron diffraction (LEED), Reflection High Energy Electron Diffraction (RHEED)Scanning Tunelling Microscopy and Atomic Force Microscopy - Graham Leggett.
