one.- I The Theory of the Formation and Nature of Radiation-Induced Defects.- 1. Production of Radiation Defects by Fast Electrons and ?-Rays.- 2. On the Production of Frenkel Defects in Diamond-type Lattices.- The 0 ? 01 transition.- Displacement into point b [(2, 0, 0,), (0, 2, 0) or (0, 0, 2)].- 3. Defect Production by Neutrons and by Heavy Charged Particles.- 4. Defect Production by Ionization Processes.- II Experimental Study of Radiation Defects in Semiconductors and Control of Semiconductor Properties by Irradiation.- 1. Threshold Energy of Defect Production in Germanium, Silicon and Other Semiconductors.- 2. Optical and Photoelectric Investigation of Radiation-Induced Defects.- Photoconductivity Spectra.- Photoconductivity relaxation.- 3. Investigation of Defects by Electron Paramagnetic Resonance (EPR) and by Measurement of Changes in the Magnetic Properties.- E-centers.- J- and C-centers.- B-centers.- 4. Interaction of Radiation-Induced Defects with Impurities.- Energy spectrum of radiation-induced defects in silicon.- Radiation defects in lithium-doped silicon 60 Radiation-induced defects in pure germanium and in gold-doped germanium.- 5. Stability and Annealing of Radiation Defects in Semiconductors..- Low-temperature irradiation and annealing.- 6. The Influence of Defect Clusters, Produced by Fast Neutrons and Heavy Charged Particles, on the Properties of Semiconductors.- 7. Structural Investigation of Radiation Defects in Semiconductors.- Data on isolated (point) defects.- Radiation-induced defect clusters in germanium and silicon.- Radiation-induced defect clusters in semiconductor compounds of the AIII BV type.- Electron microscopy methods.- 8. Influence of Radiation Defects on the Thermal Conductivity of Semiconductors.- 9. Radiation Doping of Semiconductors.- Ion implantation of dopants.- ¿Channeling ¿ of charged particles in crystals.- Doping by nuclear reactions (transmutation doping).- III Ionization in Semiconductors as a Result of the Stopping of Charged Particles, Absorption and Scattering of Photons.- 1. Energy Losses on Ionization.- Energy losses by charged particles.- Ionization as a result of absorption and scattering of ?-radiation and X-rays.- 2. Mean Ionization Energy in Semiconductors.- 3. Energy Consumed in the Ionization and Excitation of Lattice Vibrations.- Two.- I Radiation Effects in Transistors.- 1. Experimental Determination of the Properties of Irradiated Transistors.- 2. Main Functions Determining the Rate of Change of Transistor Parameters as a Result of Bulk Processes. Criteria of Radiation Stability of Transistors.- 3. Behavior of Transistors Irradiated with Large Doses.- 4. Effect of Recombination at p-n Junctions on the Current Transport Coefficient of Transistors.- 5. Dependence of Radiation-Induced Changes in the Lifetime of Minority Carriers on the Electrophysical Properties of Irradiated Semiconductor Materials.- Germanium.- Silicon.- 6. Surface Effects in Irradiated Transistors.- 7. Influence of Operating Conditions and Irradiation Temperature on the Radiation Stability of Transistors.- 8. Some Problems of Thyristor Operation Under Irradiation.- II Radiation Effects in Semiconductor Diodes.- 1. Stable Radiation-Induced Changes in the Forward Branch of the V-I Characteristics of Diodes.- 2. Experimental Data on Changes in the Conductivity of Germanium and Silicon upon Irradiation.- 3. Radiation-Induced Changes in the Reverse V-I Characteristics of Diodes.- 4. Effect of Radiation on the Parameters of ¿Stabilitrons¿..- III Effect of Pulsed Radiation on Semiconductor Devices.- 1. Characteristics of Pulsed Irradiation of Semiconductor Devices.- 2. Ionization Current in p-n Junctions.- 3. Equivalent Diode Circuit Modelling Diode Response to Ionizing Radiation Pulses.- 4. Response of Transistors to Ionizing Radiation Pulses and Equivalent Circuits.- 5. Experimental Data on the Effect of Pulsed Radiation on Semiconductor Devices.
Auflage
Softcover reprint of the original 1st ed. 1977
Sprache
Verlagsort
Zielgruppe
Für Beruf und Forschung
Research
Illustrationen
98
98 s/w Abbildungen
280 p. 98 illus.
Maße
Höhe: 216 mm
Breite: 140 mm
Dicke: 16 mm
Gewicht
ISBN-13
978-1-4684-9071-8 (9781468490718)
DOI
10.1007/978-1-4684-9069-5
Schweitzer Klassifikation
one.- I The Theory of the Formation and Nature of Radiation-Induced Defects.- II Experimental Study of Radiation Defects in Semiconductors and Control of Semiconductor Properties by Irradiation.- III Ionization in Semiconductors as a Result of the Stopping of Charged Particles, Absorption and Scattering of Photons.- Two.- I Radiation Effects in Transistors.- II Radiation Effects in Semiconductor Diodes.- III Effect of Pulsed Radiation on Semiconductor Devices.