This book covers principles, advantages and drawbacks of recently developed methods for characterization of thin films. Each chapter is self-sufficient with its own separate section on background, theory, experimental set-up and procedures, and applications.
Reihe
Sprache
Verlagsort
Verlagsgruppe
Zielgruppe
Für höhere Schule und Studium
Für Beruf und Forschung
Maße
Höhe: 261 mm
Breite: 185 mm
Dicke: 25 mm
Gewicht
ISBN-13
978-0-471-62346-5 (9780471623465)
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Schweitzer Klassifikation
Microdielectrometry (D. Day); Bending-Beam Characterization of Thin Polymer Films (H. Tong & K. Saenger); Polymer Film Stress Measurement by X-Ray Diffraction (L. Nguyen); Laser Interferometry: A Measurement Tool for Thin Film Polymer Properties and Processing Characteristics (K. Saenger & H. Tong); Piezoelectric Resonators: Considerations for Use with Mechanically Lossy Media (K. Kanazawa); Ion Beam Analysis of Thin Polymer Films (P. Green & B. Doyle); Fluorescence Redistribution After Pattern Photobleaching (B. Smith); Surface Sensors for Moisture and Stress Studies (L. Nguyen); Photothermal Analysis of Thin Polymer Films( H. Coufal); Thermally Stimulated Discharge Current Measurement for Thin Polymer Films (B. Chowdhury); XPS/SIMS/AES for Surface and Interface Characterization of Thin Polymer Films (N. Chou); Prospects for Examination of Polymer Molecules with Scanning Tunneling Microscope and Atomic Force Microscope (D. Reneker); Adhesion Measurement of Thin Polymer Films by Indentation (M. Matthewson & J. Ritter); Subject Index.
