Prüflastnormal für Netzrückwirkungsmesssysteme

In the last few decades, the increasing number of electrical and electronic products (EEP) has made human life significantly easier and better. Due to the rapid increase in the EEP, which are operated on the network, the power quality in the low-voltage network caused by EEP must receive increasing attention. The power quality problem, which are caused by the EEP, were checked with compliance test systems (CTS), that are made up of three components. A test of the entire system was not carried out, as no suitable generators are available for this up to now. In this work, prototypes of test loads were developed, both for harmonic and for flicker measurements, which enable the compliance test systems (CTS) to be tested as a whole system. As an optimization, temperature control systems was developed especially for the FPL. The parameters of the PI control were individually optimized. Another optimization is the EMC protection, especially for the FPL, since when switching the FPL there is a risk that the digital circuits can be disturbed. With the help of this optimization, the digital circuits are protected. Furthermore, simulation models for all test loads were modeled with the help of a precise LCR bridge including the consideration of the inductive compensation of the input circuit. Comparison methods or validation methods for the simulation models in comparison to the HW were developed individually. Associated programs, e.g. evaluation programs, resampling programs, simulation programs, etc., have been developed for these methods and the analysis processes. With the help of some programs, the evaluations have been partially automated, and time has been saved. After the analysis with the above methods, the results were presented in this thesis, considering the measurement uncertainty. The target values of the HPL and the FPL, when they are connected to an ideal compliance test system (CTS), were simulated, and evaluated using the simulation models. However, a compliance test system (CTS) cannot be ideal, which is why phenomena with different disturbances have been investigated in this work. The harmonics from the power source and the line impedance stabilization network between the power source and the connection point of the EEP in a compliance test system (CTS) were investigated as the main disturbances in this work. In this work, the influences of numerous different disturbances were analyzed. However, in the future, there will still be a need to do further research, such as, to analyze the effects of disturbance with several harmonics at the same time.