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Optically Active Charge Traps and Chemical Defects in Semiconducting Nanocrystals Probed by Pulsed Optically Detected Magnetic Resonance

Kipp Van Schooten(Autor*in)
Springer (Verlag)
Erschienen am 9. August 2015
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Softcover
XIV, 90 Seiten
978-3-319-03328-0 (ISBN)
106,99 €inkl. 7% MwSt.
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