Basic characteristics of synchrotron radiation and its related facilities and instrumentations, M. Terasawa and M. Kihara; X-ray flourescence analysis, H. Saisho and S. Hashimoto; microbeam and chemical state analysis, S. Hayakawa and Y. Gohshi; X-ray absorption fine structure, H. Oyanagi; application to surface structure analyses, T. Ohta, K. Asakura and T. Tokoyama; structure analysis by small-angle X-ray scattering, K. Kajiwara and Y. Higari; the Rietveld method and its applications to synchtrotron X-ray paowder data, F. Izumi; X-ray microtomography, K. Usami and T. Hirano.