The original Handbook of Surface and Interface Analysis: Methods for Problem-Solving was based on the authors' firm belief that characterization and analysis of surfaces should be conducted in the context of problem solving and not be based on the capabilities of any individual technique. Now, a decade later, trends in science and technology appear to have validated their assertions.
Major instrumental assets are generally funded and maintained as central facilities to help potential users make informed decisions about their appropriate use in solving analytical problem(s). Building on the popular first edition, this long-awaited second edition was motivated by the increasingly common industry view that it is more cost-effective to contract out analytical services than to maintain in-house facilities. Guided by that trend, this book focuses on developing strategic thinking for those who decide which facilities to access and where to subcontract analytical work. It covers most of the major tactical issues that are relevant at the location in which data are being produced.
New Information in this Second Edition Includes:
Electron-optical imaging techniques and associated analytical methods
Techniques based on synchrotron sources
Convenient and versatile scanning probe group methods
Scanning tunneling microscopy, biocompatible materials, and nano-structured materials
Assessing benefits and limitations of different methodologies, this volume provides the essential physical basis and common modes of operation for groups of techniques. Exploring methods for characterization and analysis of particular types of materials and/or their relevant applications-the text synergizes traditional and novel ideas to help readers develop a versatile and rational approach to surface and interface analysis.
Rezensionen / Stimmen
This handbook on surface and interface analysis can help to create that knowledgeable person ... sufficient in-depth technical information to satisfy those who want to know the details ... Material scientists, engineers, materials researchers, or anyone who needs information about a material obtained using surface analysis methods will find this handbook an excellent resource for determining the best approach and the right techniques to use.
-IEEE Electrical Insulation Magazine, Vol. 26, No. 3, May-June 2010
Auflage
Sprache
Verlagsort
Verlagsgruppe
Zielgruppe
Für Beruf und Forschung
Professional
Produkt-Hinweis
Illustrationen
402 s/w Abbildungen, 42 s/w Tabellen
42 Tables, black and white; 402 Illustrations, black and white
Maße
Höhe: 260 mm
Breite: 183 mm
Dicke: 41 mm
Gewicht
ISBN-13
978-0-8493-7558-3 (9780849375583)
Copyright in bibliographic data and cover images is held by Nielsen Book Services Limited or by the publishers or by their respective licensors: all rights reserved.
Schweitzer Klassifikation
Oxford University, Yarnton. UK Oxford University, Yarnton, UK Santa Barbara Science Project, Santa Barbara, USA
Herausgeber*in
Oxford University, Yarnton, UK
Oxford University, Yarnton, UK
Introduction. Elements of Problem-Solving/Materials Characterization. How to Use This Book. Spectroscopic Techniques. Compositional Analysis by AES and XPS. Ion Beam Techniques. In-Depth Analysis. Surface and Interface Analysis by HRTEM and XTEM. Synchrotron-based Techniques. Scanning Force Microscopy. Scanning Tunneling Microscopy. Metallurgy. Minerals, Ceramics, and Glasses. Composites. Corrosion. Tribology. Catalysts. Adhesion. Biocompatible Materials. Nano-structured Materials.