This book discusses the complex technology of building CMOS computer chips and covers some of the unusual problems that can occur during chip manufacturing. Readers will learn how plasma and process damage results from the high-energy processes that are used in chip manufacturing, causing harm to the chips, functional failure and reliability problems.
Sprache
Verlagsort
Verlagsgruppe
Springer International Publishing
Zielgruppe
Illustrationen
31
368 farbige Abbildungen, 31 s/w Abbildungen
XIX, 466 p. 399 illus., 368 illus. in color.
Maße
Höhe: 241 mm
Breite: 160 mm
Dicke: 32 mm
Gewicht
ISBN-13
978-3-031-89028-4 (9783031890284)
DOI
10.1007/978-3-031-89029-1
Schweitzer Klassifikation
Kirk D. Prall (M'82) was born in 1958. He received the Ph.D. degree in electrical engineering from the University of New Mexico, Albuquerque, in 1990. He worked for Philips Semiconductors from 1982 to 1991, in the areas of EPROM, ROM, microprocessors. He joined Micron, Inc., Boise, ID, in 1991 working on DRAM, NOR, NAND, and emerging memories. He retired from Micron in 2019 and is currently writing engineering books. He has published several papers and holds more than 200 patents.
