In February of 1990, the balloting process for the IEEE proposed standard P1149.1 was completed creating IEEE Std 1149.1-1990. Later that summer, in record time, the standard won ratification as an ANSI standard as well. This completed over six years of intensive cooperative effort by a diverse group of people who share a vision on solving some of the severe testing problems that exist now and are steadily getting worse. Early in this process, someone asked me if 1 thought that the P1l49.l effort would ever bear fruit. 1 responded somewhat glibly that "it was anyone's guess". Well, it wasn't anyone's guess, but rather the faith of a few individuals in the proposition that many testing problems could be solved if a multifaceted industry could agree on a standard for all to follow. Four of these individuals stand out; they are Harry Bleeker, Colin Maunder, Rodham Tulloss, and Lee Whetsel. In that I am convinced that the 1149.1 standard is the most significant testing development in the last 20 years, I personally feel a debt of gratitude to them and all the people who labored on the various Working Groups in its creation.
Auflage
Sprache
Verlagsort
Zielgruppe
Für Beruf und Forschung
Research
Illustrationen
Maße
Höhe: 235 mm
Breite: 155 mm
Dicke: 22 mm
Gewicht
ISBN-13
978-1-4613-5041-5 (9781461350415)
DOI
10.1007/978-1-4615-0367-5
Schweitzer Klassifikation
1 Boundary-Scan Basics and Vocabulary.- 1.1 Digital Test Before Boundary-Scan.- 1.2 The Philosophy of 1149.1.- 1.3 Basic Architecture.- 1.4 Non-Invasive Operational Modes.- 1.5 Pin-Permission Operational Modes.- 1.6 Extensibility.- 1.7 Subordination of IEEE 1149.1.- 1.8 Costs and Benefits.- 1.9 Other Testability Standards.- 2 Boundary-Scan Description Language (BSDL).- 2.1 The Scope of BSDL.- 2.2 Structure of BSDL.- 2.3 Entity Descriptions.- 2.4 Some advanced BSDL Topics.- 2.5 BSDL Description of 74BCT8374.- 2.6 Packages and Package Bodies.- 2.7 Writing BSDL.- 2.8 Summary.- 3 Boundary-Scan Testing.- 3.1 Basic Boundary-Scan Testing.- 3.2 Testing with Boundary-Scan Chains.- 3.3 Porting Boundary-Scan Tests.- 3.4 Boundary-Scan Test Coverage.- 3.5 Summary.- 4 Advanced Boundary-Scan Topics.- 4.1 DC Parametric IC Tests.- 4.2 Sample Mode Tests.- 4.3 Concurrent Monitoring.- 4.4 Non-Scan IC Testing.- 4.5 Non-Digital Device Testing.- 4.6 Mixed Digital/Analog Testing.- 4.7 Multi-Chip Module Testing.- 4.8 Firmware Development Support.- 4.9 In-System Configuration.- 4.10 Flash Programming.- 4.11 Hardware Fault Insertion.- 4.12 Power Pin Testing.- 5 Design for Boundary-Scan Test.- 5.1 Integrated Circuit Level DFT.- 5.2 Board-Level DFT.- 5.3 System-Level DFT.- 5.4 Summary.- 6 Analog Measurement Basics.- 6.1 Analog In-Circuit Testing.- 6.2 Limited Access Testing.- 7 IEEE 1149.4: Analog Boundary-Scan.- 7.1 1149.4 Vocabulary and Basics.- 7.2 General Architecture of an 1149.4 IC.- 7.3 The 1149.4 Instruction Set.- 7.4 Other Provisions of 1149.4.- 7.5 Design for 1149.4 Testability.- 7.6 Summary.- 8 IEEE 1149.6: Testing Advanced I/O.- 8.1 The Advanced I/O Problem.- 8.2 1149.6 Vocabulary and Basics.- 8.3 Test Facilities for Ac Pins.- 8.4 The Defect Model for 1149.6.- 8.5 The 1149.6 Test Receiver.- 8.6 BSDL Extensions for 1149.6.- 8.7 Design for 1149.6 Testability.- 8.8 Summary.- 9 IEEE 1532: In-System Configuration.- 9.1 IEEE 1532 Vocabulary and Basics.- 9.2 Programming Features of IEEE 1532.- 9.3 Design for IEEE 1532 Programmability.- 9.4 Epilog: What Next for 1149.1,1149.4,1149.6 and 1532?.- A. BSDL Syntax Specifications.- A.l Conventions.- A.2 Lexical elements of BSDL.- A.3 Notes on syntax definition.- A.4 BSDL Syntax.- A.5 User Package Syntax.- A.6 1149.6 Extention Attribute Syntax.
