High-resolution electron microscopy allows the imaging of the crystallographic structure of a sample at an atomic scale. It is a valuable tool to study nanoscale properties of crystalline materials such as superconductors, semiconductors, solar cells, zeolite materials, carbon nanomaterials or BN nanotubes.
Sprache
Verlagsort
Zielgruppe
Für Beruf und Forschung
US School Grade: College Graduate Student
Illustrationen
21
94 s/w Abbildungen, 21 s/w Tabellen
94 b/w ill., 21 b/w tbl.
Maße
Höhe: 246 mm
Breite: 175 mm
Dicke: 17 mm
Gewicht
ISBN-13
978-3-11-030472-5 (9783110304725)
Schweitzer Klassifikation
Takeo Oku, The University of Shiga Prefecture, Japan.
