The Atomic Order in Guinier-Preston Zones of Aluminum-Silver Alloys.- The Debye Temperature of Iron-Manganese Solid Solution Alloys.- Relation Between Ionic Radii and Transformation Temperature in Rare Earth Niobates.- The X-Ray Diffraction Measurement of Residual Stresses in Aluminum Alloys.- Analysis of the Broadening of Powder Pattern Peaks from Cold-Worked Face-Centered and Body-Centered Cubic Metals.- Dependence of Lattice Parameters on Various Angular Measures of Diffractometer Line Profiles.- Quantitative Determinations and Descriptions of Preferred Orientation.- A Graphical Solution for X-Ray Powder Diffraction Patterns.- A Systematic Method for Indexing Spots of Single Crystals in Laue X-Ray Photographs.- Prealloyed Iron-Nickel Powders by an Amalgamation Process.- An Explanation of Microstructures in the Tantalum-Carbon System.- X-Ray Diffractometric Examination of Low Temperature Phase Transformations in Single-Crystal Strontium Titanate.- Vacancy Related Defects in Antimony-Doped Silicon.- Depth of Saw and Lap Damage in Germanium.- Preferred Orientation in Ceramic Materials due to Forming Techniques.- A Qualitative X-Ray Examination of the Structure of Fiberglass Under Static Tensile Loading.- Precipitation of MgF2 in LiF.- A Study of Solid Solution Formation in the Milling of TiCl3-A1Cl3 Powder Mixtures.- New Technique for Quantitative SiO2 Determinations of Silicate Materials by X-Ray Diffraction Analysis of Glass.- A Study of Copper-Chromium Oxide Catalysts and a Method to Determine Catalytic Activities.- X-Ray Investigation of Aerosols from Wires Exploded in Nitrogen.- Oriented Crystallization of Amides on Collagen with Modification of the Collagen Lattice.- Technique of Measuring Low Percentages of Retained Austenite Using Filtered X-Ray Radiation and an X-Ray Diffractometer.- A Vertically Rotating Double-Crystal X-Ray Spectrometer.- Increasing the Versatility of the G. E. Diffractometer.- The Design and Use of Special Purpose Attachments for the Horizontal Diffractometer.- A Single-Crystal Orienter for the Philips Wide-Range Goniometer.- An X-Ray Absorption Method for Elemental Analysis.- Interrelationships of Sample Composition, Backscatter Coefficient, and Target Current Measurement.- Limitations of the Linear Intensity-Concentration Approximation in Electron Probe Microanalysis.- Observations Concerning the Interdiffusion of Columbium Alloy with Type 316 Stainless Steel.- Beam Quality in the Electron Probe Microanalyzer.- Instrumental Developments for Electron Microprobe Readout.- Methods of Quantitative Electron Probe Analysis.- The Applicability of Theoretically Calculated Intensity Corrections to Practical Metallurgical Problems in the Electron Probe.- Standards in Electron Probe Analysis of Minerals.- Panel Discussion on Electron Microprobe.- Application of a Pulsed Soft X-Ray System to the Determination of Phosphor Response Characteristics.- X-Ray Fluorescence Analysis for Sodium, Fluorine, Oxygen, Nitrogen, Carbon, and Boron.- Experimental Dispersing Devices and Detection Systems for Soft X-Rays.- A Comparison of the Performance of Gratings and Crystals in the 20-115 A Region.- Evaluation of a Demountable X-Ray Tube Vacuum Spectrograph for the Determination of Low-Atomic-Number Elements.- The Accurate Determination of Major Constituents by X-Ray Fluorescent Analysis in the Presence of Large Interelement Effects.- Detection Confirmation and Determination of Trace Amounts of Selenium by X-Ray Methods.- Mineralogical Problems in X-Ray Emission Analysis of Sylvite Concentrates.- X-Ray Spectrometric Determination of Composition and Distribution of Sublimates in Receiving-Type Electron Tubes.- The Determination of Thorium in Monazite by Fluorescent X-Ray Spectrometry.- X-Ray Spectrographic Analysis of the 3-d, Transition Metal Corrosion Products Using Potassium Bromide Disks.- X-Ray Fluorescence Analysis of Niobate-Tantalate Ore Concentrates.- Improved Trace Analysis with the Use of Synchronized Electronic Discrimination in an X-Ray Scanning Procedure.- X-Ray Tube Parameters and their Effects on Fluorescence Analysis.- The Design and Performance of the Dual Function Spectrodiffractometer and Automatic Programmer.- Performance of an Unattended Automated X-Ray Spectrograph.- Author Index.
