The book covers various methods of characterization of advanced materials commonly used in engineering including understanding of the working principle and applicability of devices. It explores the techniques implemented for advanced materials like superalloys, thin films, powders, nanocomposites, polymers, shape memory alloys, high entropy alloys, and so on. Major instruments covered include X-ray diffraction, near-field scanning optical microscopy Raman, X-ray photospectroscopy, ultraviolet-visible-near-infrared spectrosphotometer, Fourier-transform infrared spectroscopy, differential scanning calorimeter, profilometer, and thermogravimetric analysis.
Features:
Covers material characterization techniques and the development of advanced characterization technology
Includes multiple length scale characterization approaches for a large variety of materials, from nano- to micron-scale, as well as their constraints
Discusses advanced material characterization technology in the microstructural and property characterization fields
Reviews both practical and theoretical explanations of approaches for characterizing microstructure and properties
Offers fundamentals, basic instrumentation details, experimental approaches, analyses, and applications with case studies
This book is aimed at graduate students and researchers in materials science and engineering.
Reihe
Sprache
Verlagsort
Verlagsgruppe
Zielgruppe
Für Beruf und Forschung
Academic and General
Illustrationen
52 s/w Zeichnungen, 5 s/w Photographien bzw. Rasterbilder, 57 s/w Abbildungen
52 Line drawings, black and white; 5 Halftones, black and white; 57 Illustrations, black and white
Maße
Höhe: 234 mm
Breite: 156 mm
Dicke: 8 mm
Gewicht
ISBN-13
978-1-032-37511-3 (9781032375113)
Copyright in bibliographic data and cover images is held by Nielsen Book Services Limited or by the publishers or by their respective licensors: all rights reserved.
Schweitzer Klassifikation
Autor*in
University of Johannesburg, South Africa
Madanapalle Institute of Technology & Science, India
NIT Jamshedpur, India
1.Introduction to material characterization 2. X-Ray Diffraction (XRD) 3. Nanomechanical system 4. X-Ray photo spectroscopy (XPS) 5. Scanning electron microscope (SEM) 6. Field emission scanning electron microscope (FESEM) 7. Transmission electron microscope (TEM) 8. Atomic Force Microscope (AFM) 9. Near-field scanning optical microscope Raman 10. Optical characterization instruments 11. Synchrotron techniques 12. Other advanced instruments used for characterization of functionally graded materials
