Comprehensive textbook covering characterization techniques to understand the chemistry and structure of materials on surfaces and at interfaces
Surface and Interface Analysis is a comprehensive textbook resource that covers everything readers need to know about surface energy, molecular speciation, and optical and physical characterization techniques. Assuming only basic knowledge of general chemistry (electronic orbitals, organic functional groups), physics (electromagnetic waves, Maxwell equations), physical chemistry (Schroedinger equation, harmonic oscillator), and mathematics (wave equations, covariance matrix), this textbook helps readers understand the underlying principles of the discussed characterization techniques and enables them to transform theoretical knowledge into applied skills through a Maieutic pedagogical approach.
Written by a highly qualified professor, Surface and Interface Analysis: Principles and Applications includes information on:
Relationship between atomic and molecular orbitals and compositional analysis principles based on measurements of photoelectrons, Auger electrons, X-rays, and secondary ions emitted from the surface
Governance of electromagnetic wave propagation in a dielectric medium and what can be learned from analyzing the electromagnetic wave reflected from the interface
Surface metrology using light reflection (non-contact) and scanning probe (contact) and analysis of mechanical properties through indentation
Artifacts and misinterpretations that may be encountered during analysis
Surface and Interface Analysis is an ideal textbook resource on the subject for graduate students in the fields of solid state physics, optics, materials science, chemistry, and engineering who want to learn and apply advanced materials characterization methods, along with undergraduate students in advanced elective courses.
Sprache
Verlagsort
Zielgruppe
Für höhere Schule und Studium
Produkt-Hinweis
Broschur/Paperback
Klebebindung
Maße
Höhe: 272 mm
Breite: 217 mm
Dicke: 28 mm
Gewicht
ISBN-13
978-1-394-21834-9 (9781394218349)
Copyright in bibliographic data and cover images is held by Nielsen Book Services Limited or by the publishers or by their respective licensors: all rights reserved.
Schweitzer Klassifikation
Seong H. Kim, PhD, is Distinguished Professor at the Department of Chemical Engineering of The Pennsylvania State University, USA. He is also affiliated with the Department of Materials Science and Engineering and the Department of Chemistry. He received his BS and MS degrees from Yonsei University, South Korea, and his PhD from Northwestern University, USA. He then worked as a postdoctoral researcher at the University of California, Berkeley, USA, before joining the faculty of chemical engineering at Penn State.
Autor*in
Pennsylvania State University, USA; Yonsei University, South Korea; Northwestern University, USA
Preface xi
About the Companion Website xv
1 Introduction 1
1.1 Types of Surface Analysis 1
1.2 Why Is Surface Analysis Done in Vacuum? 1
1.3 Surface Energy 6
1.4 Relationship Between Surface Energy and Physical Properties 8
1.5 Measuring Surface Energy 10
1.6 Bulk Properties Affected by Surface Energy 14
1.7 Further Reading for Surface Contamination and Vacuum 16
Practice Problems 16
References 17
2 Elemental Analysis via X-ray Irradiation 19
2.1 Electron Emission upon X-ray Absorption 19
2.2 Instrumentation for X-ray Photoelectron Spectroscopy (XPS) 27
2.3 Qualitative Analysis with XPS 37
2.4 Quantitative Analysis with XPS 48
2.5 Depth Profiling with XPS 68
2.6 Chemical Analysis with X-ray Absorption Spectroscopy (XAS) 73
2.7 Further Reading for XPS 78
Practice Problems 79
References 84
3 Elemental Analysis via Electron Irradiation 89
3.1 Principle of Auger Electron Spectroscopy (AES) 89
3.2 Qualitative Analysis with AES 93
3.3 Quantitative Analysis with AES 96
3.4 Scanning Auger Mapping 97
3.5 Further Reading for AES 99
Practice Problems 100
References 100
4 Elemental Analysis via Ion Irradiation 103
4.1 Principle of Secondary Ion Mass Spectrometry (SIMS) 103
4.2 Qualitative Analysis with SIMS 106
4.3 Quantitative Analysis with SIMS 111
4.4 Further Reading for SIMS 112
Practice Problems 112
References 113
5 Light Propagation, Absorption, and Reflection 115
5.1 Propagation and Absorption of Electromagnetic Wave 116
5.2 Reflection/Refraction at Interface of Two Media 128
5.3 Further Reading for IR and Raman Spectroscopy 139
Practice Problems 139
References 139
6 Spectroscopic Analysis via IR Reflection and Transmission 141
6.1 Attenuated Total Reflectance Infrared (ATR-IR) Spectroscopy 143
6.2 Specular Reflection Infrared (SR-IR) Spectroscopy 151
6.3 Reflection Absorption Infrared Spectroscopy (RAIRS) 158
6.4 Brewster-Angle Transmission (BAT) Infrared Spectroscopy 176
6.5 Diffuse-Reflectance Infrared Fourier Transform (DRIFT) Spectroscopy 180
6.6 IR Spectroscopic Imaging 183
6.7 Further Reading for Surface-Sensitive IR Spectroscopy 192
Practice Problems 192
References 193
7 Buried Interface Analysis via Nonlinear Spectroscopy 197
7.1 Nonlinear vs. Linear Optical Responses 197
7.2 Sum Frequency Generation (SFG) Process 200
7.3 SFG Spectroscopy Probing 2D Interface 211
7.4 SFG Spectroscopy Probing Noncentrosymmetric Domains in 3D Bulk 233
7.5 Further Reading for SFG 251
Practice Problems 251
References 253
8 Multivariate Data Analysis 257
8.1 Least Squares Analysis 258
8.2 Factor Analysis 261
8.3 Matrix Algebra for Principal Component Analysis (PCA) and Principal Component Regression (PCR) 263
8.4 Further Reading for Multivariate Analysis 281
Practice Problems 281
References 282
9 Thin Film Analysis via Reflectometry and Ellipsometry 283
9.1 Recap of Light Reflection and Transmission Principles 283
9.2 Reflectometry 285
9.3 Ellipsometry 288
9.4 Spectroscopic Ellipsometry (SE) 295
9.5 Mueller Matrix Ellipsometry (MME) 306
9.6 Further Reading for Ellipsometry 314
Practice Problems 314
References 315
10 Topography Analysis via Light Reflection 317
10.1 White Light Interferometry (WLI) 317
10.2 Surface Roughness 326
10.3 Further Reading of Optical Profilometry 328
Practice Problems 328
References 329
11 Topography Analysis via Scanning Probe 331
11.1 Tip-Sample Interactions in Atomic Force Microscopy (AFM) 331
11.2 Force Measurement Through Cantilever Deflection 339
11.3 Cantilever Oscillation in Noncontact and Tapping Mode AFM 341
11.4 Surface Deformation in Contact Mode AFM 345
11.5 Scanning AFM Probe 348
11.6 Material Properties Measured Along with Topography 357
11.7 Further Reading for AFM 362
Practice Problems 362
References 365
12 Mechanical Analysis via Indentation 369
12.1 Modulus, Hardness, and Toughness 369
12.2 Nanoindentation 371
12.3 Micro-indentation 375
12.4 Hidden Factors Affecting Indentation Measurement 379
12.5 Further Reading for Nanoindentation 388
Practice Problems 388
References 391
Index 393
