Thin films play an increasingly important role in daily life (for example, non-reflecting glasses) and also in the development of high-tech materials. This text covers the latest developments in spectroscopic in-situ techniques that provide tools for the real-time analysis necessary for the development of thin films.
Sprache
Verlagsort
Zielgruppe
Für höhere Schule und Studium
Für Beruf und Forschung
Maße
Höhe: 240 mm
Breite: 170 mm
ISBN-13
978-3-527-29524-1 (9783527295241)
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Schweitzer Klassifikation
Introduction to interfacial spectroscopy; in-situ infra-red spectroscopy; in-situ linear optical spectroscopy; in-situ second harmonic generation; frequency mixing spectroscopy; in-situ x-ray surface diffractometry (XRD and GIXD); future developments of spectroscopic in-situ techniques. Appendices: Formulas, list of acronyms.
