Electron Microscopy and Analysis 1991, Proceedings of the Institute of Physics Electron Microscopy and Analysis Group Conference held 10-13 September 1991, University of Bristol, UK

Surface analysis. High resolution electron microscopy. Electron energy loss spectroscopy. Environmental electron microscopy. Scanning and auger electron microscopy. Applications - metals and semiconductors. Applications - ceramics and inorganics. Beam damage and beam sensitive materials. Convergent beam electron diffraction. Microanalysis. Alternative imaging. New instrumentation. Late papers.