Auflage
Sprache
Verlagsort
Verlagsgruppe
Springer International Publishing
Zielgruppe
Editions-Typ
Illustrationen
15
109 s/w Abbildungen, 15 farbige Abbildungen
XI, 196 p. 124 illus., 15 illus. in color.
Maße
Höhe: 241 mm
Breite: 160 mm
Dicke: 17 mm
Gewicht
ISBN-13
978-3-319-39876-1 (9783319398761)
DOI
10.1007/978-3-319-39877-8
Schweitzer Klassifikation
Ray Egerton is Professor Emeritus of Physics at the University of Alberta and at Portland State University. He serves as the Physical Sciences Editor for Micron, The International Research and Review Journal for Microscopy.
Prof. Egerton has published 90 full papers in refereed journals and is the author of Electron Energy-Loss Spectroscopy in the Electron Microscope, (3rd Edition, 2011, Springer). His awards include the Presidential Science Award from the Microbeam Analysis Society, the Distinguished Scientist Award from the Microscopy Society of America, and the Frances Doane Award for service to the Microscopical Society of Canada. He is a fellow of the Royal Society of Canada.
An Introduction to Microscopy.- Electron Optics.- The Transmission Electron Microscope.- TEM Specimens and Images.- The Scanning Electron Microscope.- Analytical Electron Microscopy.- Special Topics.- Appendix: Mathematical Derivations.
