This third themed volume in the series "Advances in Spectroscopy" covers surface analysis which has become increasingly popular in recent years. Topics in this volume are electron-excited surface spectroscopy, photoelectron spectroscopy for surface studies, infrared reflection-absorption spectroscopy for surface studies, infrared reflection-absorption spectroscopy of adsorbed molecules, high-resolution electron energy loss spectroscopy, Raman spectroscopic studies of chemisorption and catalysis, surface-enhanced Raman spectroscopy, applications of SERS to biochemical systems, unenhanced surface Raman spectroscopy, integrated optics for surface spectroscopy and SIMS for surface analysis. All contributions are written by well respected researchers in the field.
Reihe
Sprache
Verlagsort
Verlagsgruppe
Zielgruppe
Für höhere Schule und Studium
Für Beruf und Forschung
Illustrationen
Maße
Höhe: 240 mm
Breite: 160 mm
Gewicht
ISBN-13
978-0-471-91895-0 (9780471918950)
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Schweitzer Klassifikation
Structure and Orientation in Thin Films: Raman Studies with Integrated Optical Techniques; Surface Rules for Surface-Enhanced Raman Spectroscopy; The Application of Surface- Enhanced Raman Scattering to Biochemical Systems; Static SIMS for Surface Analysis; Inelastic Electron Tunnelling Spectroscopy in Chemistry; Electron-Excited Surface Spectroscopies; Electron Energy Loss Spectroscopy; Infrared Reflection-Absorption Spectroscopy of Adsorbed Molecules.
