The aim of this text is to present the background, important concepts, and tabulated data of Auger electron spectroscopy (AES) and X-ray photoelectron spectroscopy (XPS) in a practical context for those involved in applied surface analysis techniques.
Auflage
Sprache
Verlagsort
Verlagsgruppe
Zielgruppe
Für höhere Schule und Studium
Für Beruf und Forschung
Editions-Typ
Illustrationen
262 line figures, 24 half-tones, 30 tables, index
Maße
Höhe: 235 mm
Breite: 156 mm
Gewicht
ISBN-13
978-0-471-93823-1 (9780471938231)
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