Scanning Tunneling Microscopy and Spectroscopy

In the decade since its inventions, the scanning tunneling microscope (STM) has had a dramatic impact in a wide range of fields, including materials science, semiconductor physics, biology, electro-chemistry. Scanning tunneling microscopy provides three-dimensional, real-space images of surfaces at high spatial resolution; when the sample is clean and flat, even atoms can be imaged. The extreme usefulness of STM helps explain its nearly instantaneous acceptance as a characterization tool. Indeed, scanning tunneling microscopy carries electron tunneling one step further. This handbook is addressed to the large community of STM users that has developed in recent years as several companies have successfully commercialized STM systems. The book should interest material scientists, electrochemists, physical chemists, both in academic and industrial settings.
More specifically, the book should interest purchasers commercial STMs; people who attend the numerous STM shortcourses offered by several technical societies; surface scientists modifying their equipment to include STM capabilities, sutdents in characterization sources of university materials science programs; research administrators considering adding STM systems to their labs and technicians in materials labs.