A range of topics and perspectives in classification, clustering, statistics and data analysis are brought together in this volume, including surveys, new methods for clustering objects, and procedures for analysing multivariate or relational data. Emphasized are probabilistic models, pattern recognition and image analysis, the analysis of strains and molecules, algebraic methods from lattice and consensus theory, correspondence and canonical analysis, and the interference between classification and retrieval or expert systems.
A range of topics and perspectives in classification, clustering, statistics and data analysis are brought together in this volume, including surveys, new methods for clustering objects, and procedures for analysing multivariate or relational data. Emphasized are probabilistic models, pattern recognition and image analysis, the analysis of strains and molecules, algebraic methods from lattice and consensus theory, correspondence and canonical analysis, and the interference between classification and retrieval or expert systems.
Sprache
Verlagsort
Verlagsgruppe
Elsevier Science & Technology
Zielgruppe
Für höhere Schule und Studium
Für Beruf und Forschung
Maße
Höhe: 230 mm
Breite: 150 mm
ISBN-13
978-0-444-70404-7 (9780444704047)
Copyright in bibliographic data is held by Nielsen Book Services Limited or its licensors: all rights reserved.
Schweitzer Klassifikation
Survey Lectures. Clustering and Classification Methods. Probabilistic Methods in Cluster Analysis. Pattern Recognition and Discrimination Methods. Consensus and Aggregation Methods. Biological Taxonomy, Phylogenies, and Sequence Analysis. Similarity Representation, Scaling Methods, and Valuations. Linear Data Analysis and Extensions.lgebraic Methods of Data Analysis. Special Topics from Data Analysis and Statistics. Classification and Data Bases, Expert Systems, Information Retrieval, and Computational Aspects. Invited Papers (by: J.C. Gower; R.D. Luce; F. Murtagh; H. Niemann; R.R. Sokal; E.N. Trifonov; F. Critchley; I.C. Lerman; G. De Soete; M.P. Windham; L.C.A. Corsten; P.A. Devijver, M.M. Dekesel; J.A. Hartigan; T. Saito; K.-D. Wernecke, G. Kalb, E. Sturzebecher; J.P. Barthelemy, B. Monjardet; W.H.E. Day; D.P. Faith; B. Leclerc; M.D. Hendy et al.; D. Sankoff et al.; J.D. Carroll, W.S. DeSarbo, G. De Soete; B. Fichet; K.R. Gabriel, C.L. Odoroff, S. Choi; W.J. Heiser; L. Hubert, P. Arabie; Y. Escoufier; A. Rizzi; C.J.F. Ter Braak; B. Ganter; M. Nagel, H.-J. Dobberkau; E. Backer; F. Gebhardt).
