This volume contains the proceedings of the Tenth International Converence on Secondary Ion Mass Spectrometry (SIMS X). It covers a diverse field of research ranging from environmental problems to depth profiling and semiconductors. In doing so, it provides an excellent overview of current research and technology by acknowledged experts in their specialised fields.
Reihe
Auflage
Softcover reprint of the original 1st ed. 1979
Sprache
Verlagsort
Verlagsgruppe
Zielgruppe
Für Beruf und Forschung
Research
Illustrationen
Maße
Höhe: 229 mm
Breite: 152 mm
Dicke: 18 mm
Gewicht
ISBN-13
978-3-642-61873-4 (9783642618734)
DOI
10.1007/978-3-642-61871-0
Schweitzer Klassifikation
I. Fundamentals Chairpersons: D.E. Harrison and C.A. Evans, Jr..- II. Quantitation Chairpersons: D.B. Wittry and P. Williams.- III. Semiconductors Chairpersons: C.W. Magee and W. Werner.- IV. Static SIMS Chairperson: A. Benninghoven.- V. Metallurgy Chairpersons: J.D. Brown and A.P. von Rosenstiel.- VI. Instrumentation Chairpersons: D.S. Simons and F.G. Rüdenauer.- VII. Geology Chairpersons: J. Okano and C. Meyer.- VIII. Panel Discussion Chairperson: I.L. Kofsky.- IX. Biology Chairpersons: M.S. Burns and G.H. Morrison.- X. Combined Techniques Chairpersons: C. Johnson and W.H. Christie.- XI. Postdeadline Papers.- Index of Authors.
