This volume contains the proceedings of the 9th International Conference on Secondary Ion Mass Spectrometry (SIMS IX), held in Yokohama, Japan, in November 1993. The contributors explore a range of research issues, from environmental problems to depth profiling and semiconductors.
Sprache
Verlagsort
Verlagsgruppe
Zielgruppe
Für höhere Schule und Studium
Für Beruf und Forschung
Maße
Höhe: 278 mm
Breite: 153 mm
Gewicht
ISBN-13
978-0-471-94218-4 (9780471942184)
Copyright in bibliographic data and cover images is held by Nielsen Book Services Limited or by the publishers or by their respective licensors: all rights reserved.
Schweitzer Klassifikation
Herausgeber*in
University of Tokyo, Japan
Osaka University, Osaka, Japan
Technical University of Vienna, Austria
Fundamentals; Quantification; Instrumentation; Post Ionization; CsX+-SIMS; ToF-SIMS; Surface Analysis; Combined Techniques; Imaging and Focused Ion Beam; Applications; Depth Profiling and Semiconductors; Organic and Biological Materials; Insulators and Metals; Geological Materials; Environmental Problems; Workshops.
