This book introduces the techniques of neutron and x-ray reflectometry and presents the studies carried out to date, using the techniques to understand emerging phenomena at the interfaces of thin films.
Reihe
Sprache
Verlagsort
Zielgruppe
Produkt-Hinweis
Fadenheftung
Gewebe-Einband
Illustrationen
With figures in colour and black and white
Maße
Höhe: 254 mm
Breite: 178 mm
Dicke: 11 mm
Gewicht
ISBN-13
978-0-7503-4693-1 (9780750346931)
DOI
10.1088/978-0-7503-4695-5
Copyright in bibliographic data and cover images is held by Nielsen Book Services Limited or by the publishers or by their respective licensors: all rights reserved.
Schweitzer Klassifikation
Autor*in
Homi Bhabha National Institute (India)
Bhabha Atomic Research Centre (India)
