X-ray methods applied to the characterization of substances of scientific and industrial interest continue to expand. The Denver Conference on Applications of X-Ray Analysis provides the forum by which developments in techniques, instrumentation and applications are communicated to those who have interest in X-ray methods. In recent years, a trend has developed for the conference to alternate emphasis annually between X-ray diffraction and X-ray spectrometry, yet provide a quality program in each area every year. The conference held August 3-5, 1977, followed this trend. The invited papers in the opening session represent a broader scope than the usual classification. The use of X-ray photons as an energy source for the excitation of optical emission was pre- sented. The application of such techniques to selected lanthanides has been known for several years. However, V. A. Fassel presented new results in which X-rays were used to excite optical emission from aromatic organic compounds. The potential for X-ray laser applications is great. R. C. Elton gave an excellent review of the state of the art and recent advances in X-ray laser research.
The results indicate that X-ray lasers are in the future, perhaps not the near future.
Sprache
Verlagsort
Verlagsgruppe
Springer Science+Business Media
Zielgruppe
Illustrationen
31 black & white illustrations, biography
ISBN-13
978-0-306-38421-9 (9780306384219)
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Schweitzer Klassifikation
X-Ray Techniques in Chemical Analysis.- Recent Advances in X-Ray Laser Research.- Interdependence of X-Ray Diffraction and X-Ray Fluorescence Data.- Applications of X-Ray Spectrometry in Metals and Mining.- Analysis of Agglomerate and Slag by Energy Dispersive X-Ray Fluorescence (Note).- X.R.F. Analysis of Steelmaking Slags Using Special Sample Preparation Techniques.- Spectrochemistry in the Iron Foundry: X-Ray Fluorescence VS. Optical Emission.- Reliability of Energy Dispersive X-Ray Fluorescence Analysis of Low-Alloy Steels.- X-Ray Fluorescence Capabilities for Uranium Ore Analysis.- Determination of Uranium in Carbonate Solutions by Extraction Onto a Chemically Modified Surface.- Energy Dispersive XRF Analyses of Bauxites (Note).- X-Ray Fluorescence Minor- and Trace-Element Analyses of Silicate Rocks in the Presence of Large Interelement Effects.- Standardless Thickness Measurement of Steel Coatings by X-Ray Fluorescence Spectrometry (Note).- An X-Ray Fluorescence Coating Gauge for Paint Thickness.- Calculations and Parameters in X-Ray Spectrometry and Absorptiometry.- Excitation Efficiencies for K and L X-Ray Fluorescence by a Mo Transmission Tube.- Calculation of X-Ray Fluorescence Cross Sections for K and L Shells.- Adaptation of the Fundamental Parameters Monte Carlo Simulation to Edxrf Analysis with Secondary Fluorescer X-Ray Machines.- Method of Measurement of Mean Concentration for an Element Segregated in Layers by X-Ray Analysis (Note).- A New Device for the Precise Measurement of X-Ray Attenuation Coefficients and Dispersion Corrections (Note).- Errors in Dual X-Ray Beam Differential Absorptiometry.- X-Ray Fluorescence Instrumentation and Application Considerations.- X-Ray Fluorescence Analysis Applied to Small Samples.- On Energy Dispersive Properties of the Proportional Counter Channel.- A Radioisotope on-Stream Analyzer for the Mining Industry.- A Theoretical Study of the Effects of Dead Layers on Low Energy X-Ray Detectors.- Evaluation of Pulse Pileup Rejection (Note).- Getting Accurate Intensity Values from Energy Dispersive X-Ray Spectra Using Fixed Energy Windows.- Verification of Stability and Precision for Energy-Dispersive XRF Systems.- Frequency Shift of L-Valence Band Spectra of Niobium and Tin in Nb3Sn Compound (Note).- Proton Induced X-Ray Emission Analysis.- The Relevance of Proton Induced X-Ray Analysis to the Study of Separate Mineral Phases.- Elemental Analysis of Biomedical Samples by Pixe (Note).- X-Ray Powder Diffraction.- USE of Automated X-Ray Diffraction Analysis in Studies of Natural Hydrothermal Systems.- Qualitative Analysis of Complicated Mixtures by Profile Fitting X-Ray Diffractometer Patterns.- Optimal Calibration Curves for Guinier-Type Focusing Cameras.- Measuring Triaxial Stresses in Embedded Particles by Diffraction (Note).- A Versatile Position Sensitive X-Ray Detector.- Author Index.
