This volume describes how current methods of surface and thin film analysis, microscopy, and electron microscopy in combination with optical measurements and spectroscopy can be used in research and development, and in the production of glasses, glass ceramics, and thin film coatings. All these methods can contribute to the main aims of development and production, i.e., to develop useful properties of the surface of glass and glass ceramics, either coated or not, and to reproduce these properties within the wanted accuracy under the most economic conditions of production. The book is conceived as a monograph; the individual chapters on the corresponding subjects, however, are written by experts who cooperate with or are at Schott. Illustrating examples and numerous references are provided throughout the book.
Reihe
Auflage
Sprache
Verlagsort
Verlagsgruppe
Springer-Verlag Berlin and Heidelberg GmbH & Co. KG
Zielgruppe
Für Beruf und Forschung
Research
Illustrationen
180 s/w Abbildungen
180 black & white illustrations
Maße
Höhe: 235 mm
Breite: 155 mm
ISBN-13
978-3-540-58609-8 (9783540586098)
Copyright in bibliographic data is held by Nielsen Book Services Limited or its licensors: all rights reserved.
Schweitzer Klassifikation
Herausgeber*in
Schott AG, Mainz, Germany
Interaction of Electromagnetic Radiation with Dielectrics.- Electromagnetic Radiation for Surface and Coating Analysis.- Interaction of Energetic Electrons with Solids.- Analysis of Surfaces and Thin Films with Electron Beams and Electron Microscopy.- Interaction of Fast Ions with Solids.- Analysis with Secondary Ion Mass Spectrometry (SIMS) and the Ion Beam Spectrochemical Analyzer (IBSCA).- Analysis of the Depth Distributions of Element Concentrations and Structures.- Analysis, Surface Analyis, and Depth Profiling of Insulating Materials with Secondary Neutral Sputtered Neutral Mass Spectrometry (SNMS).- Ion Microprobes Based on SIMS, IBSCA, and SNMS.- Surface and Thin Film Analysis by Elastic Scattering of High Energy Ions (RBS, ERDA).- Surface Imaging with Scanning Tips to Complement Analysis and Electron Microscopy.- Appropriate Selection of Analysis Methods, the Preparation and the Handling of Samples.
