Advances in Imaging and Electron Physics features cutting-edge articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
Reihe
Sprache
Verlagsort
Verlagsgruppe
Elsevier Science Publishing Co Inc
Zielgruppe
Für Beruf und Forschung
Physicists, electrical engineers and applied mathematicians in all branches of image processing and microscopy as well as electron physics in general
Maße
Höhe: 229 mm
Breite: 152 mm
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ISBN-13
978-0-12-408142-0 (9780124081420)
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Schweitzer Klassifikation
Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 - 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Microscopy and Optical Societies of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics.
Early History of Wien filters
Katsushige Tsuno and Damaschin Ioanoviciu
Aberration Theory of Wien Filter
Damaschin Ioanoviciu and Katsushige Tsuno Wien Filter Instrumentation Katsushige Tsuno and Damaschin Ioanoviciu
Simulation of Multipole Wien Filters
Katsushige Tsuno and Damaschin Ioanoviciu
Wien Filter Applications to Ions
Damaschin Ioanoviciu and Katsushige Tsuno
Application of Wien filters to ElectronsKatsushige Tsuno and Damaschin Ioanoviciu