Advances in Imaging and Electron Physics
Academic Press
Erschienen am 12. August 2014
261 Seiten
978-0-12-800308-4 (ISBN)
Beschreibung
Advances in Imaging & Electron Physics merges two long-running serials-Advances in Electronics & Electron Physics and Advances in Optical & Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
- Contributions from leading authorities
- Informs and updates on all the latest developments in the field
Weitere Details
Sprache
Englisch
Verlagsort
San Diego
USA
Verlagsgruppe
Elsevier Science & Techn.
ISBN-13
978-0-12-800308-4 (9780128003084)
Copyright in bibliographic data and cover images is held by Nielsen Book Services Limited or by the publishers or by their respective licensors: all rights reserved.
Schweitzer Klassifikation
Weitere Ausgaben
Person
Inhalt
- Gaussian Beam Propagation in Inhomogeneous Nonlinear Media. Description in Ordinary Differential Equations by Complex Geometrical OpticsPawel Berczynski and Slawomir Marczynski
- Single-Particle Cryo-Electron Microscopy: Progress, Challenges, and Perspectives for Further Improvement David Agard, Yifan Cheng, Robert M. Glaeser and Sriram Subramaniam
- Morphological Amoebas and PDEsMartin Welk and Michael Breu
