Written by one of the very first practitioners of ICP-MS, Practical Guide to ICP-MS and Other Atomic Spectroscopy Techniques: A Tutorial for Beginners presents ICP-MS in a completely novel and refreshing way. By comparing it with other complementary atomic spectroscopy (AS) techniques, it gives the trace element analysis user community a glimpse into why the technique was first developed and how the application landscape has defined its use today, 40 years after it was first commercialized in 1983.
What's new in the 4th edition:
Updated chapters on the fundamental principles and applications of ICP-MS
New chapters on complementary AS techniques including AA, AF, ICP-OES, MIP-AES, XRF, XRD, LIBS, LALI-TOFMS
Strategies for reducing errors and contamination with plasma spectrochemical techniques
Comparison of collision and reaction cells including triple/multi quad systems
Novel approaches to sample digestion
Alternative sample introduction accessories
Comprehensive glossary of terms used in AS
New vendor contact information
The book is not only suited to novices and beginners, but also to more experienced analytical scientists who want to know more about recent ICP-MS developments, and where the technique might be heading in the future. Furthermore, it offers much needed guidance on how best to evaluate commercial AS instrumentation and what might be the best technique, based on your lab's specific application demands.
"I feel honored to have been asked to deliver the Foreword for this book, which is suited not only for beginners, but also for more experienced analytical scientists who want to know the advances in plasma spectrochemistry instrumentation and related future opportunities."
-Dr. Heidi Goenaga Infante, LGC Science Fellow; Chief Scientist, National Measurement Laboratory, Visiting Professor, University of Strathclyde, UK.
Reihe
Auflage
Sprache
Verlagsort
Verlagsgruppe
Zielgruppe
Für Beruf und Forschung
Academic and Professional Practice & Development
Illustrationen
50 s/w Abbildungen, 166 farbige Abbildungen, 30 s/w Photographien bzw. Rasterbilder, 1 Farbfoto bzw. farbiges Rasterbild, 49 s/w Zeichnungen, 136 farbige Zeichnungen, 31 s/w Tabellen
31 Tables, black and white; 136 Line drawings, color; 49 Line drawings, black and white; 1 Halftones, color; 30 Halftones, black and white; 166 Illustrations, color; 50 Illustrations, black and white
Maße
Höhe: 260 mm
Breite: 183 mm
Dicke: 29 mm
Gewicht
ISBN-13
978-1-032-03502-4 (9781032035024)
Copyright in bibliographic data and cover images is held by Nielsen Book Services Limited or by the publishers or by their respective licensors: all rights reserved.
Schweitzer Klassifikation
Robert (Rob) Thomas is the Principal Scientist at Scientific Solutions, a consulting company that serves the educational needs of the trace element analysis user community. He has worked in the field of atomic and mass spectroscopy for almost 50 years, including 24 years for a manufacturer of atomic spectroscopic instrumentation. He has served on the American Chemical Society (ACS) Committee on Analytical Reagents (CAR) for the past 20 years as leader of the plasma spectrochemistry, heavy metals task force, where he has worked very closely with the United States Pharmacopeia (USP) to align ACS heavy metal testing procedures with pharmaceutical guidelines. Rob has written over 100 technical publications, including a 15-part tutorial series on ICP-MS. He is also the editor of and frequent contributor to the Atomic Perspectives column in Spectroscopy magazine, as well as serving on the editorial advisory board of Analytical Cannabis. In addition, Rob has authored five textbooks on the fundamental principles and applications of ICP-MS. Prior to this new edition of Practical Guide to ICP-MS and Other Atomic Spectroscopy Techniques, his most recent book was a paperback version of Measuring Heavy Metal Contaminants in Cannabis and Hemp, published in December 2021. Rob has an advanced degree in analytical chemistry from the University of Wales, UK, and is also a fellow of the Royal Society of Chemistry (FRSC) and a Chartered Chemist (CChem).
Autor*in
Scientific Solutions, Gaithersburg, Maryland, USA
Contents
Foreword
Preface
Acknowledgements
Author Bio
Chapter 1: An Overview of ICP Mass Spectrometry
Chapter 2: Principles of Ion Formation
Chapter 3: Sample Introduction
Chapter 4: Plasma Source
Chapter 5: Interface Region
Chapter 6: Ion Focusing System
Chapter 7: Mass Analyzers: Quadrupole Technology
Chapter 8: Mass Analyzers: Double-Focusing Magnetic Sector Technology
Chapter 9: Mass Analyzers: Time-Of-Flight Technology
Chapter 10: Mass Analyzers: Collision/Reaction Cell and Interface Technology
Chapter 11: Ion Detection
Chapter 12: Peak Measurement Protocol
Chapter 13: Methods of Quantitation
Chapter 14: Review of Interferences
Chapter 15: Routine Maintenance
Chapter 16: Sampling and Sample Preparation Procedures
Chapter 17: Reducing Errors from Contamination
Chapter 18: Alternative Sampling Accessories
Chapter 19: Trace Element Speciation Techniques
Chapter 20: The ICP-MS Application Landscape
Chapter 21: Fundamental Principles and Applications of Atomic Absorption/Fluorescence
Chapter 22: Fundamental Principles and Applications of ICP Optical Emission Spectrometry
Chapter 23: Fundamental Principles of Applications of Other Atomic Spectroscopic Techniques
X Ray Analytical Techniques (XRF/XRD)
Microwave Induced Plasma Atomic Emission Spectrometry (MIP-AES)
Laser Induced Breakdown Spectrometry (LIBS)
Laser Ionization Laser Ablation Time-Of-Flight Mass Spectrometry (LALI-TOF-MS)
Chapter 24: Comparing ICP-MS With Other Atomic Spectroscopy Techniques
Chapter 25: Cost of Analysis of AS Techniques
Chapter 26: How to Select an ICP-MS: Some Important Analytical Considerations
Chapter 27: Glossary of Terms Used in Atomic Spectroscopy (AS)
Chapter 28: Useful Contact Information
