The book is a collection of articles covering basic crystallography, local texture measurements with high energy synchrotron radiation, evolution of textures, texture mapping by scanning X-ray diffraction, absorption tomography for three dimensional measurements in bulk materials, ultra thin films specular X-ray reflectivity, small angle X-ray scattering, glancing incidence X-ray diffraction and X-ray line profile analysis. A large number of chapters cover the application of the Rietveld refinement technique for different materials. The application of high temperature X-ray diffraction to different materials is also discussed. Apart from this the application of X-ray diffraction techniques to characterize the materials is dealt with in different areas; such as magnetic materials, nano materials, aluminum alloys, titanium alloys, biomaterials, forensic application of textile fabrics, sensors, steels and surface modifications. It also covers the geometrical aspects of X-ray diffractometer and related applications.
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ISBN-13
978-1-58603-537-2 (9781586035372)
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Schweitzer Klassifikation
CONTENTS INCLUDE: Crystal Geometry and Symmetry; Local Texture Measurements with High-Energy Synchrotron Radiation; Texture Mapping by Scanning X-ray Diffraction and Related Methods; Deformation Bands in Texture Formation in Cold and Warm Rolling Interstitial -- Free Steel; Texture Determination of Zircaloy Using X-ray and EBSD Diffraction; Texture Analysis Using General Area Diffraction Detector System; Determination of Preferred Orientation Factors of Zirconium Alloy Components Using Characterisation of Microstructure, Texture and Residual Stress of PHWR Fuel Clad Material using X-ray Diffraction; Effect of Iridium Buffer Layer on YNi2B2C Thin Film Growth; X-ray Diffraction and Absorption Tomography for Three Dimensional Measurements in Bulk Material.
