The introductory paper in this book gives an overview of the most significant attempts to use knowledge based systems for test and diagnosis. The overview includes: - systems which employ knowledge engineering - systems which employ frames and/or slots - systems which represent knowledge using some form of calculus - systems which attempt to imitate human expertise. Chapter I deals with test planning and text expertise, including AI aspects of designing testable chips, economic problems and the HITEST experience. Chapter II covers the most obvious application of AI techniques: knowledge based diagnosis. A survey paper looks at various systems, while the other papers report on practical experiences. Chapter III reports on rule based design verification and maintenance, the papers dealing with electrical verification of integrated circuits, board verification with an application in an industrial environment, and rule based maintenance.
The introductory paper in this book gives an overview of the most significant attempts to use knowledge based systems for test and diagnosis. The overview includes: - systems which employ knowledge engineering - systems which employ frames and/or slots - systems which represent knowledge using some form of calculus - systems which attempt to imitate human expertise. Chapter I deals with test planning and text expertise, including AI aspects of designing testable chips, economic problems and the HITEST experience. Chapter II covers the most obvious application of AI techniques: knowledge based diagnosis. A survey paper looks at various systems, while the other papers report on practical experiences. Chapter III reports on rule based design verification and maintenance, the papers dealing with electrical verification of integrated circuits, board verification with an application in an industrial environment, and rule based maintenance.
Sprache
Verlagsort
Verlagsgruppe
Elsevier Science & Technology
Zielgruppe
Für höhere Schule und Studium
Für Beruf und Forschung
Illustrationen
Maße
ISBN-13
978-0-444-88113-7 (9780444881137)
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Schweitzer Klassifikation
Introduction. Knowledge Based Systems for Test and Diagnosis (M.A. Breuer et al.). Test Strategy Planning and Test Expertise. AI Aspects of TEST: A System for Designing Testable VLSI Chips (M.A. Breuer, Rajiv Gupta, Rajesh Gupta). A Tool for Testability Analysis and Design for Testability of VLSI Devices (G. Buonanno, D. Sciuto). Cost Effective Test Strategy Selection (C. Dislis et al.). Test Planning from High-Level Specifications (M. Crastes de Paulet, M. Karam, G. Saucier). The Types of Knowledge Required for an Expert Test Advisor (S. Cosgrove, G. Musgrave). Artificial Intelligence Techniques in HITEST (P.S. Parry). Knowledge Based Diagnosis. Survey of Diagnosis Expert Systems (O. Raoult). Knowledge Engineering Issues in Constraint Based Diagnosis (F. Malabocchia). Experience with an Expert Diagnostic System Shell (D. Kennett, K.A.E. Totton). APEX: An Expert System Shell for Technical Diagnosis and Maintenance (T. Billoir). Rule Based Design Verification and Maintenance. Electrical Verification Using Rule Based Programming and Symbolic Analysis (I. Bolsens et al.). Rule Based Board Verification (M. Crastes de Paulet, P. Bayle). An Expert System for Maintenance Program Generation (C. Robach, N. Mardam-Bek, D. Lutoff).
