Electron microscopy is now a mainstay characterization tool for solid state physicists and chemists as well as materials scientists. Containing the proceedings from the Electron Microscopy and Analysis Group (EMAG) conference in September 2003, this volume covers current developments in the field, primarily in the UK. These conferences are biennial events organized by the EMAG of the Institute of Physics to provide a forum for discussion of the latest developments in instrumentation, techniques, and applications of electron and scanning probe microscopies.
Sprache
Verlagsort
Verlagsgruppe
Zielgruppe
Für Beruf und Forschung
Academic and Professional Practice & Development
Maße
Höhe: 235 mm
Breite: 157 mm
Dicke: 32 mm
Gewicht
ISBN-13
978-0-7503-0967-7 (9780750309677)
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Schweitzer Klassifikation
Stephen McVitie, David McComb
Plenary Lectures Functional Materials and Biomaterials New Instrumentation Imaging Theory Theory of Microscopy and Spectroscopy Structural Materials Advances in Nanoanalysis Advances in Imaging Sample Preparation and Nanofabrication Surfaces and Interfaces Nanomaterials Author Index Subject Index
