
Analysis of Step-Stress Models
Existing Results and Some Recent Developments
Academic Press
Erschienen am 15. Juni 2017
Buch
Softcover
186 Seiten
978-0-12-809713-7 (ISBN)
Beschreibung
Analysis of Step-Stress Models: Existing Results and Some Recent Developments describes, in detail, the step-stress models and related topics that have received significant attention in the last few years. Although two books, Bagdonavicius and Nikulin (2001) and Nelson (1990), on general accelerated life testing models are available, no specific book is available on step-stress models. Due to the importance of this particular topic, Balakrishnan (2009) provided an excellent review for exponential step-stress models. The scope of this book is much more, providing the inferential issues for different probability models, both from the frequentist and Bayesian points-of-view.
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Sprache
Englisch
Verlagsort
San Diego
USA
Verlagsgruppe
Elsevier Science Publishing Co Inc
Zielgruppe
Für Beruf und Forschung
Produkt-Hinweis
Broschur/Paperback
Klebebindung
Maße
Höhe: 229 mm
Breite: 152 mm
Dicke: 15 mm
Gewicht
310 gr
ISBN-13
978-0-12-809713-7 (9780128097137)
Copyright in bibliographic data and cover images is held by Nielsen Book Services Limited or by the publishers or by their respective licensors: all rights reserved.
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Debasis Kundu | Ayon Ganguly
Analysis of Step-Stress Models
Existing Results and Some Recent Developments
E-Book
06/2017
Academic Press
91,95 €
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Personen
Debasis Kundu is a Professor in the Department of Mathematics and Statistics at the Indian Institute of Technology Kanpur, India, which he joined in 1990. He had previously worked as Assistant Professor at the University of Texas at Dallas, USA, after completing his PhD in Statistics at Pennsylvania State University, USA. His research interests include statistical signal processing, nonlinear regression, distribution theory, statistical computing, and reliability and survival analysis. Ayon Ganguly is an Assistant Professor in the Department of Mathematics, at the Indian Institute of Technology Guwahati, India. He received his PhD in Statistics from the Department of Mathematics and Statistics, Indian Institute of Technology Kanpur, India. His research interests include reliability and survival analysis.
Autor*in
Rahul and Namita Gautam Chair Professor, Department of Mathematics and Statistics, Indian Institute of Technology Kanpur, India
Department of Mathematics, Indian Institute of Technology Guwahati, India
Inhalt
1. Introduction2. Cumulative Exposure Model3. Other related models4. SSLT with Multiple Failure Modes5. Miscellaneous Topics