An up-to-date overview of the different x-ray based methods in the hot fields of nanoscience and nanotechnology, including methods for imaging nanomaterials, as well as for probing the electronic structure of nanostructured materials in order to investigate their different properties. Written by authors at one of the world's top facilities working with these methods, this monograph presents and discusses techniques and applications in the fields of x-ray scattering, spectroscopy and microscope imaging.
The resulting systematic collection of these advanced tools will benefit graduate students, postdocs as well as professional researchers.
Auflage
Sprache
Verlagsort
Zielgruppe
Illustrationen
126
21 farbige Abbildungen, 126 s/w Abbildungen
Maße
Höhe: 24 cm
Breite: 17 cm
Dicke: 1.9 cm
Gewicht
ISBN-13
978-3-527-32288-6 (9783527322886)
Schweitzer Klassifikation
Jinghua Guo is a staff scientist of Advanced Light Source at Lawrence Berkeley National Laboratory. Having obtained his academic degrees from Zehjiang University, China (BS) and Uppsala University, Sweden (PhD), he spent his career working as faculty member in Uppsala University before taking up his present appointment at LBNL. His research interest has been soft x-ray spectroscopy and materials science. Dr. Guo has authored over 180 peer-reviewed scientific publications.
Herausgeber*in
Lawrence Berkeley National Laboratory, Berkeley, USA
Introduction
High Resolution Soft X-Ray Microscopy for Imaging Nanoscale Magnetic Structures and their Spin Dynamics
Advances in Magetization Dynamics Using Scanning Transmission X-Ray Microscopy
Scanning Photoelectron Microscopy for Novel Nanomaterials Characterization
Coherent X-Ray Diffraction Microscopy
Many-Body Interactions in Nanoscale Materials by Angle Resolved Photoemission Spectroscopy
Soft X-Ray Absorption and Emission Spectroscopy in the Studies of Nanomaterials
